The Advantest Q8344A is a benchtop optical spectrum analyzer spanning 350 nm to 1750 nm, engineered around Fourier spectrum analysis using a Michelson interferometer. This architecture enables direct optical coherence length measurements—a capability absent in monochromator-based instruments. The analyzer delivers wavelength resolution to 0.05 nm at 0.85 µm, wavelength accuracy of ±0.1 nm, and measurement speeds of approximately 1.5 seconds per sweep across any analysis span. Dynamic range reaches 80 dB with input sensitivity from −70 dBm to +10 dBm across the 0.7 µm to 1.6 µm band. A built-in He-Ne laser reference ensures long-term measurement repeatability without external calibration.
Technical Specifications
• Wavelength Range: 350 nm to 1750 nm
• Measurement Principle: Fourier spectrum analysis; Michelson interferometer
• Wavelength Resolution: 0.05 nm maximum (at 0.85 µm); 0.1 nm (at 1.31 µm)
• Wavelength Accuracy: ±0.1 nm (at 1.3 µm, vacuum reference)
• Measurement Speed: ~1.5 seconds per sweep
• Span Range: 0.1 nm to 140 nm/DIV
• Input Sensitivity: −70 dBm to +10 dBm (0.7 µm to 1.6 µm)
• Level Accuracy: ±2.0 dB or less (at 0.85 µm and 1.31 µm)
• Linearity: ±1.0 dB/25 dB or less; ±0.5 dB/10 dB or less
• Dynamic Range: 80 dB
• Reference: Built-in He-Ne laser
– Key Features
• Direct coherence length measurement capability via Michelson interferometer architecture
• Fiber input: 50 µm standard; optional 200 µm available
• Manual transportation lock on interferometer mechanism
• GP-IB interface for instrument control
• Optional built-in printer (Option 01)
• Horizontal orientation required; 10 cm minimum clearance around air vents
– Typical Applications
• Laser diode characterization in optical data storage systems
• Fiber optic gyroscope laser evaluation
• LED and photoemitting element analysis
• Telecommunications and data communications component testing
• Optical device manufacturing quality assurance
– Compatibility & Integration
Benchtop form factor with GP-IB interface support. Operates in controlled environments free from thermal transients, mechanical shock, vibration, moisture, dust, and external magnetic fields.
