The Aeroflex MTG-2000-06 is a multi-tone signal generator engineered for precision characterization of high-power amplifiers (HPAs) and multi-carrier power amplifiers (MCPAs) in advanced RF testing environments. It generates up to 16 continuous wave signals simultaneously with internally combined outputs that suppress intermodulation products to very low levels. This capability eliminates reliance on digital modulators or application-specific filtering, enabling accurate verification of amplifier performance against Adjacent Channel Power (ACP) metrics and other key parameters in modern wireless communication systems.
Technical Specifications
• Frequency Range: 800 MHz to 1,000 MHz (Cellular Module); 1,700 MHz to 2,200 MHz (PCS Module)
• Frequency Resolution: 10 Hz
• Frequency Stability: ± 0.1 ppm (constant ambient temperature)
• Channels: Configurable up to 16 synthesizers (typically 8 or 16 tones)
• Output Power: +7 dBm to +60 dBm (800–1,000 MHz); 19.5 dBm nominal per individual tone (rear panel RF output)
• Power Control: 0.1 dB minimum programmable step; up to 10 dB tone-to-tone variation
• Phase Control: 0–359 degrees in 1-degree increments; 2 degrees/hour phase drift (post–1 hour warm-up)
• Envelope Peak Factor: ± 0.5 (after peaking)
– Key Features
• Internally combined multi-tone outputs with controlled intermodulation products
• Phase-peaked mode for worst-case peak power verification
• Continuous random phase mode simulating real-world conditions with 6–10 dB peak power variation
• Per-tone individual RF outputs on rear panel for flexible measurement configurations
• Supports Cellular (800–1,000 MHz) and PCS (1,700–2,200 MHz) frequency modules
– Typical Applications
• HPA and MCPA performance characterization and validation
• Adjacent Channel Power (ACP) requirement verification (>65 dB down; >−75 dB for GSM/EDGE)
• Multi-carrier signal simulation for wireless communication systems
• Amplifier response testing under peaking and random phase conditions
– Compatibility & Integration
• IEEE bus command set support for ATE integration
• LabVIEW driver available for automated test equipment incorporation
