The Agilent HP 5335A Universal Counter measures frequency, period, time interval, ratio, totalize, pulse width, rise and fall time, duty cycle, slew rate, relative phase, and inverse time interval with single-shot resolution to 2 ns and averaged resolution to 100 ps. Designed for electronic development and test environments, it operates up to 200 MHz on Channel A, 100 MHz on Channel B, with optional 1.3 GHz capability on Channel C. Advanced triggering, built-in math and statistics functions, and HP-IB (IEEE-488) interface support complex analysis and automated test system integration.
Technical Specifications
Measurement Ranges:
• Frequency: 200 MHz (Channel A), 100 MHz (Channel B), optional 1.3 GHz (Channel C)
• Period: 10 ns to 10^7 seconds
• Time Interval: 0 ns to 10^7 seconds; single-shot 2 ns resolution, averaged 100 ps resolution
• Ratio: A/B and C/A measurements
• Totalize: Up to 100 MHz (Channel A)
• Pulse Width: 5 ns to 10^7 seconds; trigger point 40% to 60% of pulse height
• Rise and Fall Time: 20 ns to 10 ms; repetition rates 50 Hz to 25 MHz (50% duty cycle); minimum 500 mV peak-to-peak, 20 ns minimum pulse width
• Duty Cycle: 1% to 99% (0 to 100 MHz); 10% to 90% (Auto Trigger); 20% to 80% (Rise/Fall Time)
• Slew Rate: 50 V/µs to 10^8 V/µs
• Phase: ±180° to 360° (or 0° to 360° with Range Hold); 30 Hz to 1 MHz; minimum 100 mV rms
• Inverse Time Interval: 10 to 10^9 units/second
Input Characteristics (Channels A & B):
• DC coupled: 0 to 100 MHz; AC coupled 1 MΩ: 30 Hz to 100 MHz; AC coupled 50 Ω: 200 kHz to 100 MHz
• Sensitivity (×1): 25 mV rms sine; 75 mV peak-to-peak pulse (5 ns minimum width)
• Dynamic Range (×1): 75 mV to 5 V peak-to-peak (≤100 MHz); 75 mV to 2.5 V peak-to-peak (>100 MHz)
• Signal Range (×1, DC): −5 V to +5 V
• Crosstalk (×1): <500 mV rms (0–100 MHz); <250 mV rms (100–200 MHz)
• Trigger Level (×1): −5 V to +5 V adjustable; Auto Trigger ON preset to 50% signal point
– Key Features
• Dual-channel inputs with optional third channel to 1.3 GHz
• Multiple measurement functions in single instrument
• HP-IB (IEEE-488) interface for test automation
• Built-in statistics and math computation
• Advanced trigger capabilities
– Typical Applications
• RF and analog circuit characterization
• Timing and frequency validation in development
• Automated production test
• Signal integrity measurements
– Compatibility & Integration
HP-IB (IEEE-488) standard interface enables integration into automated test systems and data acquisition setups.
