The Keysight E2616A is a wedge probe adapter engineered for non-invasive probing of surface-mount integrated circuits in TQFP and PQFP packages. It eliminates the soldering requirements and mechanical risks associated with traditional probe methods, delivering stable electrical connections through dual contact points per IC lead.
Technical Specifications
• Product Type: Wedge Probe Adapter
• Signal Capacity: 8 signals
• Lead Pitch Compatibility: 0.65 mm
• Probing Mechanism: Mechanically non-invasive wedge design
• Contact Points: Two per IC leg
– Key Features
• Dual-contact architecture enhances electrical connection integrity without mechanical damage to component leads
• Eliminates accidental pin shorting during probe placement
• Soldering-free connection method simplifies field deployment
• Stable positioning for high-speed digital signal measurement
• Designed for reliable, repeatable measurements on densely packed surface-mount packages
– Typical Applications
The E2616A addresses common probing challenges in board-level testing and debugging of modern surface-mount assemblies, particularly where fine-pitch lead access and measurement accuracy are critical. Its wedge design accommodates the tight spacing and mechanical constraints of contemporary IC packages without introducing damage risk.
– Compatibility & Integration
Specifically engineered for TQFP and PQFP packages with 0.65 mm lead pitch. The adapter integrates directly into standard probing workflows, eliminating the need for custom soldered connections or complex mechanical fixturing. Easy insertion and secure placement make it suitable for both laboratory and production environments.
