The Keysight E2960B is a modular test system for PCI Express Gen1 and Gen2 protocol analysis and exercising. It delivers non-intrusive probing across x1 through x16 lane widths, combined with integrated stimulus and response capabilities to accelerate debug cycles and compliance validation. The system captures genuine signal characteristics without alteration, providing context-sensitive protocol visibility from physical layer through transaction layer.
Technical Specifications
• Data rates: 2.5 Gb/s and 5 Gb/s PCI Express traffic
• Trace memory: up to 4 GB (x16 analyzers)
• Link training lock times: 3 to 5 Fast Training Sequences (FTS) typical
• Supported lane widths: x1 through x16
• Probe types: Mid-bus 2.0, Flying Lead 2.0, and slot interposer probes
• Signal integrity: Low-capacitance loading, minimal distortion and jitter across all probe types
– Key Features
• Automated Link Training and Status State Machine (LTSSM) exerciser
• Protocol analysis with context-sensitive display and flow capabilities
• Predefined compliance test suite
• Slot interposer probes available for all link widths
• Mid-bus probes with designed-in header connections
• Flying lead probes for direct board soldering
• Protocol Test Series (PTS) 2.0 with over 170 PCI-SIG compliance test scripts
• Coverage: transaction layer, data link layer, and configuration space testing
• Hardware upgradeable to compliance assured test package
– Typical Applications
• PCI Express design verification across Gen1 and Gen2 protocols
• Active State Power Management (ASPM) testing
• Device Under Test (DUT) behavior analysis and validation
• PCIe compliance certification testing
• Multi-lane link characterization and debug
– Compatibility & Integration
• Supports Gen1 and Gen2 PCI Express specifications
• Non-intrusive measurement without signal alteration
• Integrated analyzer and exerciser for synchronized stimulus-response testing
