The Agilent/Keysight E4805A is a central clock module for parallel bit error ratio testing (ParBERT) platforms, engineered to synchronize measurement modules and generate a synthesized system clock for high-speed digital communication verification. Operating as a core component within the E48xxA and 81250 ParBERT ecosystems, it enables precise timing across Mux/Demux, SerDes, and multi-channel transceiver characterization. The module supports clock frequencies from 1 kHz to 660 MHz and accommodates external analyzer clocks recovered from devices under test, making it essential for telecommunications, storage networking, and IC test applications requiring synchronized multi-channel operation.
Technical Specifications
Clock Generation and Input
• Central clock frequency range: 1 kHz to 660 MHz
• Input frequency range: 170 kHz to 250 MHz; 660 MHz with option 660; 330 MHz when DATA IN1 is used in detect-mode
• Main output bit rates: 170 kbit/s to 250 Mbit/s; optional 660 Mbit/s available
• Auxiliary outputs disabled above 250 Mbit/s
• Analyzer clock: 1 sampling point per bit
• External analyzer clock: Recovered clock from DUT with minimum eye-opening >400 ps
System Integration
• Compatible platforms: Agilent/Keysight E48xxA and 81250 ParBERT
• Supported data rates: 675 Mb/s to 45 Gb/s (platform dependent)
• Internal jitter/wander requirement: Eye-opening >50% of bit period and >1 ns minimum
Pattern Generation
• PRBS lengths: n = 7, 9, 10, 11, 15, 17, 20, 21, 23, 31 (CCITT O.151); normal or inverted
• Memory per channel: 64 Kbit to 1024 Kbit (bit rate dependent)
• Pseudo-Random Word Sequences (PRWS) support
• User-defined and mixed data pattern capability
• Maximum frame length: 24 ms with 1 to 16 bit resolution
• Guard time: 0 to 24 ms between cells; 10 ps resolution
• Cell transfer delay: Manual entry <24 ms with 10 ps granularity
– Key Features
• Supports multiple transmitter and receiver testing
• 10 GbE and Forward Error Correction (FEC) device verification
• Amplifier testing capability
• Extension for high-speed channels within IC testers
– Typical Applications
• Serializer/Deserializer (SerDes) characterization
• Multiplexer/demultiplexer testing
• Multi-channel transceiver validation
• High-speed optical and electrical link verification
– Compatibility & Integration
Designed exclusively for Agilent/Keysight E48xxA and 81250 ParBERT platforms. Functions as a modular component within larger BERT system architectures, providing centralized clock synchronization across parallel test channels.
