The Agilent/Keysight E5250A Low-Leakage Switch Mainframe is a modular instrument that transforms single measurement stations into automated test systems. It accommodates plug-in cards configured as cross-point matrices for parametric measurements or multiplexers for long-term reliability testing. The mainframe enables parallel device testing and significant channel expansion, reducing test times while maintaining high accuracy and reliability in critical measurement scenarios.
Technical Specifications
Measurement Performance:
• Measurement resolution: 20 femtoamps (fA) through the switch with compatible instruments (4156C, B1500A, E5270B HRSMU)
• Transient current settling time: Less than 3.5 seconds to below 450 fA after 10 V input step
• Bandwidth: 10 MHz (-3 dB) with E5252A cards
• Channel isolation: 10 teraohms (TΩ) on low-current triaxial paths using E5252A cards
Matrix Switch Configuration (Option 001):
• 10 inputs × up to 48 outputs (scalable 10 × 12 to 10 × 48 per frame)
• Two low-leakage inputs and four standard inputs for I-V measurements
• Two C-V paths with capacitance compensation
• Two auxiliary inputs for pulsed, differential voltage, and specialized measurements
Multiplexer Configuration (Option 501):
• 24-channel (8 × 3) multiplexer architecture
• System expansion: Up to four E5250A mainframes ganged for 384 total output channels
Architecture Details (E5252A Matrix Cards):
• Inputs: 6 low-current triaxial + 4 general-purpose coaxial
• Output configurations: x12, x24, x36, x48 triaxial
• Triaxial inputs 1–4 feature dedicated internal paths
• Triaxial inputs 5–6 and coaxial inputs are multiplexed (3:1) on two shared paths
Architecture Details (E5255A Multiplexer Cards):
• Inputs: 6 low-current triaxial + 3 DC-bias coaxial per card
• Output configurations: x24, x48, x72, x96 triaxial
– Key Features
• Supports E5252A matrix cards (Kelvin or non-Kelvin switching) and E5255A multiplexer cards
• Modular card-based design for flexible test configuration
• Controllable and automatable via Keysight EasyEXPERT software
• Low-leakage architecture for precision current measurement
– Typical Applications
• Parametric device testing with high-resolution current measurement
• Long-term multisite reliability and burn-in testing
• Automated parallel device characterization
• Transient and pulsed measurement configurations
– Compatibility & Integration
Integrates with Keysight measurement instruments including the 4156C, B1500A, and E5270B HRSMU. Compatible with EasyEXPERT software control and existing Keysight/Agilent test infrastructure.
