The Anritsu 3680K Universal Test Fixture enables precision characterization of microwave components from DC to 40 GHz. Built for microstrip and coplanar waveguide device evaluation, it delivers 0.1 dB insertion loss repeatability and >17 dB return loss (DC to 20 GHz) to support demanding development and production environments. The fixture accommodates substrate thicknesses from 0.13 mm to 1.9 mm and lengths up to 5 cm, with optional MMIC and multi-port testing capabilities.
Technical Specifications
• Frequency Range: DC to 40 GHz
• Connector Type: Anritsu K Connector®
• Repeatability: 0.1 dB insertion loss
• Return Loss: >17 dB (DC to 20 GHz); >14 dB (20 to 40 GHz)
• Substrate Thickness: 0.13 mm to 1.9 mm
• Substrate Length: 0.5 cm to 5 cm maximum (3680-20 model: 10 cm maximum)
• Maximum Line Offset: ±1.2 cm (3680-20 model: ±2.5 cm)
• Operating Temperature: -20 °C to 70 °C
• Dimensions: 10 cm × 12.7 cm × 6.4 cm
– Key Features
• Accommodates offset and right-angle test devices
• Supports substrate widths with no maximum limit
• Bias capability via RF connection or optional bias probes (up to four)
• Optional 36802 MMIC Attachment for very small substrates
• Optional Right-Angle Launchers enable up to four RF connections for multi-port testing
• Calibration and verification kits available for specific substrate thicknesses
– Typical Applications
Microstrip and coplanar waveguide component characterization; MMIC device testing; multi-port RF device evaluation; DC to 40 GHz component development and production validation.
– Compatibility & Integration
Designed for Vector Network Analyzers (VNAs) and Scalar Network Analyzers (SNAs). Compatible with optional substrate kits and calibration fixtures for enhanced measurement accuracy across standard thickness grades.
