The Anritsu 68377C is a synthesized signal generator delivering precise RF and microwave stimulus across 10 MHz to 50 GHz for defense, satellite, and wireless communication test environments. The instrument combines ultra-low phase noise with accurate leveled output power down to −120 dBm in 0.01 dB steps, meeting stringent requirements for sensitive receiver characterization. Frequency switching completes in less than 5 ms, accelerating automated test sequences. Its compact 13.3 cm footprint minimizes rack real estate while supporting SCPI programmability with IVI-COM and LabVIEW driver compatibility for seamless ATE integration.
Technical Specifications
Frequency Range & Resolution
• 10 MHz to 50 GHz standard; optional extension to 0.1 Hz
• Waveguide extensions available to 110 GHz
• Frequency resolution: 100.0 mHz minimum; 0.1 Hz with Option 11
Output Power
• +12 dBm to −15 dBm typical (−20 dBm standard)
• +17 dBm guaranteed leveled power to 20 GHz
• Leveled output to −120 dBm in 0.01 dB steps
• Step attenuator options for 20 GHz, 40 GHz, 50 GHz, and 60 GHz bands
• High power output options for 2–20 GHz and 220 GHz ranges
Phase Noise & Switching
• Ultra-low single-sideband phase noise: −107 dBc at 10 kHz offset from 10 GHz (example)
• Frequency switching: <5 ms; <5 ms for sweep steps <100 MHz
Modulation Capabilities
• AM, FM, phase, pulse, and scan modulation
• Seven internal modulating waveforms plus user-defined options
• Internal Gaussian and uniform noise generators
• Advanced internal pulse modulation for single and multiple pulse sequences
• Pulse generator supports moving target simulation, radar analysis, and fading simulation
– Key Features
• Broad 10 MHz–50 GHz coverage with optional sub-Hz and millimeter-wave extensions
• Superior spectral purity and fast frequency agility for dynamic test scenarios
• Compact form factor for space-constrained ATE racks
• Flexible modulation suite addresses radar, communications, and receiver testing
– Typical Applications
• Receiver sensitivity and blocking characterization
• Radar blind spot and recovery time analysis
• Moving target and fading simulation studies
• Multi-band wireless and satellite communication testing
– Compatibility & Integration
SCPI programmability with IVI-COM and National Instruments LabVIEW driver support enable straightforward control and automation within existing test frameworks.
