The Anritsu MP1520B is a PDH analyzer engineered for precise measurement and analysis of Plesiochronous Digital Hierarchy signals in operational and laboratory environments. The instrument generates and receives pseudo-random patterns with or without frames to simulate line traffic, enabling system evaluation, maintenance procedures, and in-service monitoring across PDH networks. It delivers simultaneous error and alarm measurements conforming to ITU-T standards, with optional capabilities for multiplexing, jitter analysis, and remote control integration.
Technical Specifications
• Supported data rates: 2, 8, 34, and 139 Mb/s PDH signals
• Input/output levels conform to ITU-T G.703
• Pattern generation and reception with or without frame structure
• Error analysis per ITU-T G.821, G.826, and M.2100
• Simultaneous error and alarm measurement capability
• Internal measurement recording with graphic display visualization
– Key Features
• Pseudo-random pattern generation approximating line traffic signals
• Built-in printer for immediate result documentation
• Intuitive user interface with simple configuration settings
• Compact, lightweight design for portable field deployment
– Optional Capabilities
• Frequency offset measurements (Option 01)
• N × 64 kb/s multiplexing/demultiplexing and hierarchical measurements (Option 02)
• Channel bipolar output configuration (Option 03)
• GPIB interface for remote control and automated data transfer (Option 04)
• Jitter generation and measurement including tolerance, output, and transfer analysis (Option 06)
– Typical Applications
• PDH signal analysis and troubleshooting
• System installation verification and commissioning
• Maintenance and performance monitoring of operational networks
• Error performance evaluation across multiple hierarchical levels
– Compatibility & Integration
The MP1520B conforms to ITU-T G.703 for all input/output specifications and supports error performance analysis standards ITU-T G.821, G.826, and M.2100. GPIB remote control capability enables integration into automated test environments and data acquisition systems.
