The Anritsu MP1800A Signal Quality Analyzer is a modular bit error rate (BER) and signal quality testing platform configured with two MU181020A Pulse Pattern Generator modules and two MU181040A Error Detector modules. This system supports data rates up to 12.5 Gbit/s per module—achieving 25 Gbit/s when both PPG modules operate in tandem, or 25 Gbit/s across dual ED modules. Options 01 and 02 provide GPIB and LAN remote control interfaces respectively, while Option 015 enables 4-slot module control for multi-channel configurations. The modular architecture accommodates future expansion and supports rates up to 56 Gbit/s when combined with Anritsu multiplexer and de-multiplexer units, making it suitable for R&D and production environments across a wide range of high-speed digital interfaces.
Technical Specifications
• Data Rate: Up to 12.5 Gbit/s per module; 25 Gbit/s with dual modules; up to 56 Gbit/s with external multiplexing/de-multiplexing units
• Pattern Generation: PRBS (2ⁿ-1, n=7, 9, 10, 11, 15, 20, 23, 31); user-programmable DATA patterns up to 128 Mbits; zero-substitute, alternate, mixed, and sequence patterns
• Output Amplitude: Up to 3.5 Vp-p (with applicable options)
• Intrinsic Jitter: 8 ps p-p (MU181020A/B-012)
• Phase Noise: SSB −75 dBc/Hz at 10 kHz offset
• Clock Sources: Internal and external
– Key Features
• Two MU181020A Pulse Pattern Generator modules for flexible test pattern synthesis
• Two MU181040A Error Detector modules for multi-channel signal analysis
• 4-slot module configuration (Option 015) for scalable testing
• GPIB (Option 01) and LAN (Option 02) remote control capabilities
• Low intrinsic jitter output for high-fidelity signal generation
– Typical Applications
• High-speed serial link characterization and validation
• BER measurement and signal quality assessment
• Multi-channel parallel testing in production environments
• R&D validation of digital interfaces up to 56 Gbit/s
– Compatibility & Integration
The modular design accommodates expansion with additional PPG and ED modules via the 4-slot mainframe. External multiplexer and de-multiplexer units enable testing of signals beyond single-module data rates.
