The Anritsu MS46522B ShockLine™ 2-Port Performance Vector Network Analyzer delivers S-parameter and time-domain measurements across passive RF and microwave devices. Five frequency configurations span 50 kHz to 92 GHz, with dynamic range to 137 dB and output power up to +13 dBm. The 3U chassis integrates SmartCal™ auto-calibration, time gating, and optional advanced time-domain signal integrity testing. LAN remote control and graphical interface support manufacturing, R&D, and educational workflows.
Technical Specifications
Frequency Coverage
• MS46522B-010: 50 kHz to 8.5 GHz
• MS46522B-020: 50 kHz to 20 GHz
• MS46522B-043: 50 kHz to 43.5 GHz
• MS46522B-082: 55 GHz to 92 GHz (1-meter tethers)
• MS46522B-083: 55 GHz to 92 GHz (5-meter tethers)
Performance Metrics
• Dynamic Range: Up to 137 dB
• Maximum Output Power: +13 dBm (default 0 dBm; +5 dBm on select models)
• Power Degradation: 0.5 dB above 8.5 GHz to 25 GHz; 1 dB above 25 GHz to 40 GHz (Options 20, 43)
• Port Match (worst of source/load): >21 dB Ports 1–2 (300 kHz–4 GHz); >15 dB both ports (4 GHz–40 GHz)
• Directivity: Excellent corrected directivity minimizes measurement uncertainty
• High Level Noise: Typically 0.005 dB magnitude and 0.05° phase (simultaneous sweep); up to 0.003 dB rms degradation in 100 MHz window around 1 GHz
Operating Conditions
• Warm-Up Time: 45 minutes
• Operating Temperature: 25 °C ± 5 °C
• Calibration Cycle: Recommended 12 months
– Key Features
• SmartCal™ auto-calibration reduces setup overhead
• S-parameter and time-domain measurement modes
• Bandpass and lowpass time-domain modes (Option -002)
• Lowpass TDR-like display for impedance characterization
• Advanced Time Domain option for signal integrity testing
• Time gating for rapid fault identification
• Tethered source/measurement modules for E-band (55–92 GHz)
• 1-meter tethers (Option 82) for benchtop; 5-meter tethers (Option 83) for OTA chambers
– Typical Applications
• Passive component characterization and validation
• Signal integrity and transmission line analysis
• Manufacturing test and process control
• Research and development of RF/microwave devices
• Educational laboratory measurements
– Compatibility & Integration
LAN-based remote control enables instrument integration into automated test systems and distributed measurement environments.
