The Astronics/EADS/Racal 1260-45B is a high-density signal routing switch matrix housed in a C-size, single-slot VXIbus module. It delivers configurable two-wire matrix topologies—most notably two 4×32 configurations—supporting applications requiring flexible signal path selection across eleven possible matrix arrangements. The module handles switching loads up to 300 VDC/ACrms and 1 A per channel, with maximum path resistance of 500 mΩ and isolation exceeding 2 GΩ.
## Technical Specifications
**Electrical Performance**
• Maximum switchable voltage: 300 VDC or ACrms (terminal-terminal or terminal-chassis)
• Maximum switchable current: 1 ADC or ACrms per channel
• Maximum switchable power: 30 WDC, 62.5 VA per channel
• Path resistance: ≤500 mΩ
• Isolation: >2 GΩ
**AC Performance (50 Ω)**
• Capacitance (Hi to Lo): <50 pF open, <80 pF closed
• Bandwidth: 25 MHz (4×16 and 4×32 configs), 20 MHz (4×64 config), 10 MHz (16×16 config)
• Crosstalk at 1 MHz: <-50 dB
**Physical & Environmental**
• Form factor: C-size, single-slot VXIbus module
• Weight: 3.07 lb (1.38 kg) without Option 01; 3.35 lb (1.51 kg) with Option 01
• Cooling: 1.0 liters/sec airflow, 0.05 mm H₂O backpressure (2.0 liters/sec and 0.2 mm H₂O with Option 01S/T)
## Key Features
• Eleven configurable matrix topologies; 1260-45B optimized for dual 4×32 two-wire matrices
• Non-latching guard relays at matrix row inputs—safety feature that opens signal paths on power loss
• Latching relay bypass option via jumpers for continuous signal routing
• IDC ribbon cable or discrete wire crimp connectors; one mating connector set included
## Typical Applications
• Automated test equipment signal switching and routing
• Multi-channel signal path selection in production and validation environments
• Applications requiring DC and low-frequency AC signal switching with isolation and low crosstalk
## Compatibility & Integration
The 1260-45B operates with Option 01 (native command set) or Option 01T (SCPI command set) smart controllers, providing both message-based and register-based control interfaces for integration into VXIbus test systems.
