The EIP Microwave Model 545A is a microprocessor-based frequency counter engineered for precise measurement across 10 Hz to 18 GHz. Using frequency-selective heterodyne architecture, the instrument delivers fast acquisition and automatic amplitude discrimination to isolate the largest signal in the microwave spectrum. The 12-digit LED display segregates readings into GHz, MHz, kHz, and Hz for immediate interpretation.
Technical Specifications
Frequency Coverage & Input Bands
• Band 1 (10 Hz – 100 MHz): 1 MΩ / 20 pF input impedance; BNC female connector; 25 mV rms sensitivity; maximum input 120 V rms (decreasing 6 dB/octave above 1 kHz to 3.0 V rms); damage threshold 150 V rms
• Band 2 (10 MHz – 1 GHz): 50 Ω nominal impedance; BNC female connector; -20 dBm sensitivity; maximum input +10 dBm; damage threshold +27 dBm; 30 dB dynamic range; acquisition < 50 ms typical
• Band 3 (1 GHz – 18 GHz): 50 Ω nominal impedance; Type N connector; -30 dBm sensitivity (1.0 – 12.4 GHz), -25 dBm (12.4 – 18.0 GHz); 10 watt (+40 dBm) damage protection
Time Base & Accuracy
• 10 MHz crystal oscillator with < 3 × 10⁻⁷ / month aging rate
• 10 MHz square wave output: 1 V p-p minimum into 50 Ω
• Overall accuracy: ±(1 count + time base error)
Measurement & Control
• Sample rate: variable 100 ms to 10 seconds
• FM tolerance: 20 MHz p-p at 10 MHz rate
• Tracking speed: up to 400 MHz/sec
• Automatic amplitude discrimination and front-panel diagnostics standard
– Key Features
• Multi-band input architecture for DC through microwave frequencies
• Fast acquisition times and real-time signal tracking
• Variable sampling for adaptive measurement intervals
• Integral damage protection across all input bands
– Optional Configurations
Option 01: Digital-to-Analog Converter outputs three consecutive display digits as analog voltage (rear panel).
Option 02: Power Meter module enables sine wave amplitude measurement at 0.1 dB resolution with ±0.5 dB typical accuracy and -30 dBm sensitivity; frequency and power display simultaneously.
– Typical Applications
RF component characterization, telecommunications system alignment, microwave oscillator verification, laboratory frequency analysis.
