The HP/Agilent 16451B Dielectric Test Fixture is a parallel-plate accessory for characterizing dielectric properties in solid materials. The fixture positions material under test between two electrodes to form a capacitor, measured directly by compatible LCR meters or impedance analyzers. It delivers precise determination of dielectric constant, dissipation factor, and capacitance across a broad measurement range while adhering to ASTM D150 standards.
Technical Specifications
Measurement Parameters
• Capacitance (C)
• Dissipation Factor (D)
• Dielectric Constant (εr’, εr”)
Material Under Test (MUT)
• Thickness: ≤ 10 mm
• Diameter: 10 mm to 56 mm
Frequency Range
• Usable to 30 MHz
• Compatible with instruments operating 40 Hz to 110 MHz
Voltage Rating
• ±42 V peak (AC + DC)
Operating Environment
• Temperature: 0°C to 55°C
Electrical Interface
• 4-terminal pair configuration with BNC connectors
• Cable length: approximately 0.8 m
– Key Features
• Parallel plate method enables direct electrode contact on flat, smooth materials (Electrodes A and B)
• Electrodes C and D accommodate rough or extremely thin materials
• Non-contacting air-gap measurement option available
• Supports multiple electrode configurations: rigid metal contact, thin film on MUT, and contactless operation
• Four-terminal pair design eliminates lead inductance effects and cable resistance errors
• OPEN/SHORT error correction compatible with supporting instruments
– Typical Applications
• Polymers and elastomers
• Electrical insulators
• PCB substrates
• Ceramic substrates
– Compatibility & Integration
Works with Agilent/Keysight LCR meters and impedance analyzers including E4980A, E4990A, E4285A, 4192A, 4194A, 4263B, 4268A, 4278A, 4279A, 4284A, 4285A, 4288A, and 4294A, as well as Hioki LCR instruments.
