The HP/Agilent 70843B is a 12 Gb/s Bit Error Rate Tester (BERT) designed for validating high-speed digital communication systems and components. It generates precise test patterns and analyzes signal integrity across data rates from 100 Mb/s to 12 Gb/s, supporting both R&D and production environments.
Technical Specifications
Bit Rate: 100 Mb/s to 12 Gb/s
Pattern Generation: PRBS patterns from 2^7-1 to 2^31-1; automatic or manual synchronization
Output Characteristics
• Data: Complementary, dc coupled, 50 Ω reverse terminated NRZ (normal or inverted)
• Amplitude: 0.5 V to 2.0 V peak-to-peak in 10 mV steps
• High level range: +1.5 V to −3.0 V
• Rise time (10% to 90%): Less than 30 ps typical at 2 V p-p
• Jitter: Less than 15 ps peak-to-peak at 10 Gb/s
Sub-Rate Outputs: Four data plus clock channels at 1/4 main data rate; 0.5 V to 1.0 V p-p amplitude (10 mV steps); dc coupled, 50 Ω reverse terminated
Data Input: Less than 50 mV p-p sensitivity typical at 10 Gb/s (2^23-1 PRBS, 0 V high level)
Clock/Data Delay: ±1 ns at 100–500 MHz; 1 clock period at 500 MHz to 12 GHz; 1 ps resolution throughout
Decision Threshold: +1 V to −3 V range; 1 mV resolution
Measurement Capabilities
• Period: 1 s to 100 days; 10, 100, 1000 error thresholds; 10^7 to 10^15 bits
• Modes: Manual, single period, repetitive period
• Error threshold selection: 10^-1 to 10^-8
• Optional enhanced error location analysis available (Option UHJ)
Outputs: Pattern or clock/8 trigger; error output at 0 to −0.4 V nominal
Control: HP-IB remote operation interface
– Key Features
• Sub-50 mV input sensitivity enables testing of marginal signal conditions
• Picosecond-resolution clock/data delay adjustment across the entire bit-rate range
• Flexible amplitude control and decision-threshold tuning for compliance validation
• Extended measurement periods support statistical confidence in low bit-error-rate characterization
– Physical & Power
HP MMS System II cabinet integration; 115/230 VAC input; 70 lbs ship weight
– Typical Applications
Serializer/deserializer (SerDes) validation, backplane channel characterization, optical transceiver receiver testing, communication IC characterization, and manufacturing quality assurance of high-speed digital interfaces.
