The HP/Agilent 81680A Tunable Laser Source delivers precise wavelength control across the 1460 nm to 1580 nm band with mode-hop-free tuning and dual optimized output ports. Engineered for DWDM system simulation, optical component characterization, and advanced research, this instrument combines ultra-fine wavelength resolution of 0.1 pm with absolute accuracy of ± 0.01 nm. Two distinct outputs—one optimized for low source spontaneous emission (SSE) and one for high power delivery—enable flexible test configurations from crosstalk measurement in dense-WDM channels to power-critical applications.
Technical Specifications
• Wavelength Range: 1460 nm to 1580 nm, mode-hop-free
• Wavelength Resolution: 0.1 pm (12.5 MHz at 1550 nm)
• Absolute Wavelength Accuracy: ± 0.01 nm
• Wavelength Repeatability: ± 0.5 pm to ± 1 pm (typical)
• Wavelength Stability: ≤ ± 1 pm typical over 24 hours at constant temperature
• Tuning Speed: 400 ms (1 nm step), 600 ms (10 nm step), 2.8 s (100 nm step)
• Linewidth: 100 kHz (coherence control off); > 50 MHz (coherence control on, 1480–1580 nm)
• Optical Power Stability: ± 0.01 dB (1 hour), ± 0.03 dB typical (24 hours)
• Power Repeatability: ± 0.01 dB (typical)
• Power Linearity: ± 0.1 dB to ± 0.3 dB
• Power Flatness vs. Wavelength: ± 0.1 dB to ± 0.3 dB typical
– Key Features
• Output 1 (Low SSE): Minimum power ≥ -6 dBm (1520–1570 nm), ≥ -10 dBm (1480–1580 nm), ≥ -13 dBm (1460–1580 nm); SSE ≥ 63 dB/nm (1520–1570 nm)
• Output 2 (High Power): Minimum power ≥ +5 dBm (1520–1570 nm), ≥ 1 dBm (1480–1580 nm), ≥ -3 dBm (1460–1580 nm); peak ≥ 6 dBm typical
• Built-in Optical Attenuator: Delivers > 60 dB output power dynamic range
– Typical Applications
Dense wavelength division multiplexing (DWDM) system simulation, crosstalk characterization of narrow-channel components, optical filter testing, and photonic device research.
