The JDS Uniphase MAP-AC990 is a modular instrumentation cassette designed for integration within the Multiple Application Platform (MAP) system, delivering optical test and measurement capabilities through a flexible, hot-swappable architecture. As a component of the MAP ecosystem, it operates within a common backplane infrastructure supporting over 15 different cassette types, enabling users to configure custom test solutions without system power-down or performance interruption.
## Technical Specifications
**Power Requirements**
• Input voltage: 100–125 V AC or 200–240 V AC
• Frequency: 50/60 Hz
• Power consumption: 200 VA
**Communication Interfaces**
• RS-232 serial interface
• GPIB (IEEE 488) interface
• Remote communication ports for supervisory control
## Key Features
• Hot-swappable cassette design—remove and replace modules without powering down the MAP chassis
• Automatic cassette identification via MAP firmware and console software
• Compatible with MAP+2M00 (19-inch 8-slot Master) and MAP+2B00 (9.5-inch 3-slot Benchtop) chassis configurations
• Reversible chassis architecture supporting front and rear optical access
• Integrates with MAP Console software for centralized system control and configuration
## Typical Applications
Within the MAP platform ecosystem, cassette modules address optical signal generation, amplification, attenuation, and routing functions across telecom and datacom wavelengths. The MAP-AC990 contributes to performance characterization workflows including link validation, component testing, and optical network diagnostics.
## Compatibility & Integration
The MAP-AC990 operates on the common MAP backplane and maintains compatibility with all standard MAP chassis configurations. Optional rackmount kit MAP+2A03 enables integration into 19-inch rack infrastructure. Control via RS-232 or GPIB allows integration into automated test frameworks and remote laboratory environments. The modular design eliminates downtime during instrument reconfiguration—simply exchange cassettes to adapt system function to evolving test requirements.
