The JDS Uniphase TB9226-1SP1 is a tunable grating filter engineered for dynamic wavelength selection and optical signal conditioning across the C-band and extended L-band. Built on diffraction grating technology, it delivers superior wavelength isolation and narrower passbands compared to Fabry-Perot and interference filter alternatives. The instrument operates as a precision spectral filter for single-mode fiber systems in laboratory and production test environments.
Technical Specifications
Wavelength Performance
• Tuning Range: 1460–1575 nm
• Optimized Window: 1530–1570 nm
• -3 dB Bandwidth (FWHM): 0.25 nm (±15%)
• -20 dB Bandwidth: 0.7 nm (±15%)
• Minimum Passband Width: 0.22 nm FWHM
• Tuning Resolution: 0.01 nm
• Wavelength Accuracy: ±0.2 nm
• Repeatability: ±0.05 nm
Optical Characteristics
• Insertion Loss: 45 dB
• Polarization Dependent Loss (PDL): < 0.2 dB (1530–1570 nm)
Electrical & Environmental
• Input Power: 100–240 VAC, 50–60 Hz
• Warm-up Time: 1 hour (required for specification compliance)
Fiber Interfaces
• Single-mode fiber input and output
• Standard Connector: ST/PC
• Optional: FC/PC, FC, or pigtailed FC/PC configurations
– Key Features
• Front panel keypad control for manual tuning and configuration
• GPIB (IEEE 488) and RS232 interfaces enable integration into automated test racks and control systems
• Grating-based design provides steeper roll-off and sharper spectral isolation than competing filter architectures
• Selectable narrow passbands from 0.22–1.4 nm FWHM accommodate diverse wavelength-selective requirements
– Typical Applications
• Amplified spontaneous emission (ASE) suppression in EDFA systems
• Spontaneous emission filtering from distributed feedback and tunable laser sources
• Wavelength-selective component characterization in WDM and DWDM test benches
• Tunable laser source validation and performance measurement
– Compatibility & Integration
Fully compliant with CE, UL3101-1, and CAN/CSA-C22.2 No. 1010.1 safety standards. Dual control via local keypad or remote command interfaces supports both standalone measurement and integrated automated test environments.
