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JDSU MAP-280 MAINFRAME ONLY

SKU: MAP-280Categories: Optical Component Test Systems
Brand: JDSU
30 Days Warranty30 Days Free Returns >

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  • Repair Support & OEM Spare Parts
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The JDSU MAP-280 is a compact and modular optical test platform designed for characterizing optical components and subsystems. This mainframe unit supports a variety of plug-in modules to address different testing needs in research, development, and manufacturing environments.

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$4,380.00

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Precision RF and optical test equipment sales, calibration, and repair by Aumictech. Email: sales@aumictech.com

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Equipment info

The JDSU MAP-280 is an 8-slot modular mainframe controller for optical component and subsystem characterization in laboratory and manufacturing environments. This 3 RU, 19-inch rack-mount platform accepts current MAP plug-in modules and supports hot-swapping for flexible test configuration. Built on Power PC architecture running Linux, the MAP-280 delivers insertion loss, dispersion penalty, passive and active component, laser, amplifier, transceiver, and transponder testing from DC through 40 G system operation.

Technical Specifications

Mainframe Architecture
• 8 plug-in module slots
• 19-inch rack configuration, 3 RU height
• Front- or rear-facing fiber routing orientation
• Power PC processor, Linux operating system
• Field-replaceable controller/power supply module

Interfaces & Control
• USB, GPIB, LXI-compliant Ethernet (10/100/1000Base-T)
• External DVI monitor output
• USB device support: mouse, keyboard, memory stick
• Optional MAP-200BKD graphical interface with touch screen, keypad, scroll wheel, and soft keys

Physical & Environmental
• Benchtop mainframe with rubber-accented feet for vibration isolation
• Compatible with LabVIEW, LabWindows, VisualC++, and Visual Basic drivers

– Key Features

• Hot-swappable module architecture enables rapid test reconfiguration
• Module sharing within single mainframe reduces component duplication
• Transition kit allows field-deployed MAP legacy modules to integrate with current platform
• Dual fiber routing orientation optimizes cable management in dense test environments

– Typical Applications

• Insertion loss and dispersion penalty characterization
• 10 G and 40 G optical system and subsystem validation
• Passive and active optical component testing
• Laser and optical amplifier performance assessment
• Transceiver and transponder module qualification
• Optical transmission network element development and manufacturing

– Compatibility & Integration

The MAP-280 accepts the full current MAP module portfolio and maintains backward compatibility with legacy modules via transition kit. Network connectivity supports both local instrument control and remote test automation via GPIB and LXI Ethernet. Software version 8.0.4 (December 2021) provides driver compatibility across major test automation platforms.

MPN

MAP-280

Brand Name

JDSU

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