The Keithley 2410-C is a single-channel high-voltage SourceMeter instrument combining precision DC sourcing and 6½-digit measurement in one integrated unit. It sources and measures voltage up to ±1100V and current up to ±1A within a 20W power envelope, operating in full four-quadrant source or sink mode. This eliminates the need for separate power supplies and multimeters, streamlining test setup while reducing system cost and complexity.
Technical Specifications
Sourcing and Measurement:
• Voltage source: ±1100V maximum
• Current source: ±1A maximum
• Voltage measurement: down to ±1µV
• Current measurement: down to 1pA resolution
• Basic measurement accuracy: 0.012%
• Measurement resolution: 6½ digits
• Source/sink limits: ±1.05A @ ±21V or ±21mA @ ±1100V
Performance:
• Reading rate: up to 1700 readings/second at 4½ digits (GPIB)
• Output settling time: 100µs typical to 0.1% (resistive load, 10µA–100mA range)
• Output slew rate: 0.5V/µs (1000V range, 20mA compliance); 0.15V/µs (20V range, 100mA compliance)
• Transient response: 30µs minimum recovery after load step change
• Contact check: 350µs verification speed
• Command processing: 10ms (autorange on), 7ms (autorange off)
Electrical Performance:
• Voltage regulation: 0.01% of range (line), 0.01% of range + 1mV (load)
• Current regulation: 0.01% of range (line), 0.01% of range + 1nA (load)
• Compliance accuracy: ±0.3% of range + ±0.02% of reading
• Temperature coefficient: ±(0.15 × accuracy specification)/°C (0°–18°C and 28°–50°C)
• DC floating output: up to ±250VDC from chassis ground
• Remote sense: up to 1V drop per load lead
• Over-voltage protection: user-selectable with 5% tolerance
• Over-temperature protection: automatic standby mode activation
– Key Features
• Four-quadrant operation for source and sink applications
• Integrated high-voltage source and precision measurement in single chassis
• Remote sense for accurate voltage regulation at test point
• Programmable digital I/O for handler and prober control
• Keithley Trigger Link interface for synchronized multi-instrument systems
– Typical Applications
Semiconductor characterization, power device testing, optoelectronic component validation, automotive sensor qualification, medical device production test.
– Compatibility & Integration
Standard interfaces: SCPI, GPIB, RS-232. Programmable DIO port enables direct integration with automated test handlers and probing systems.
