The Keithley 4200A-CVIV I-V/C-V Multi-Switch Module is an accessory that expands the switching and measurement capabilities of the Keithley 4200A-SCS Parameter Analyzer. This multi-switch module enables automated characterization of multiple devices and test points, supporting both current-voltage (I-V) and capacitance-voltage (C-V) measurements. By eliminating manual re-probing between test sites, the module improves test throughput and measurement accuracy across semiconductor device analysis workflows.
Technical Specifications
Switching Architecture
• Multi-switch module configuration for automated device selection
• Engineered to maintain signal integrity across I-V and C-V characterization measurements
• Interfaces directly with the Keithley 4200A-SCS mainframe via dedicated host connection
Electrical Integration
• Signal levels and voltage/current handling capacity determined by the 4200A-SCS parameter analyzer mainframe
• DUT interface accommodates standard connectors and specialized interfaces compatible with wafer probers, test sockets, and custom test fixtures
– Key Features
• Automated multi-device test point selection without manual re-probing
• Dual-measurement support for both I-V and C-V characterization in a single module
• Optimized signal path design for precision device measurement
• Direct integration with 4200A-SCS ecosystem
– Typical Applications
• Semiconductor device characterization requiring multi-point analysis
• Materials research and electrical property evaluation
• Failure analysis and diagnostic testing
• Quality control testing of multiple device configurations
– Compatibility & Integration
The 4200A-CVIV operates exclusively with the Keithley 4200A-SCS Parameter Analyzer mainframe. DUT connections support wafer probe cards, test sockets, and custom fixtures through standard and specialized connector interfaces. The module integrates within or connects to the 4200A-SCS system architecture.
