The Keysight 81200A is a modular, scalable data generator and analyzer platform for digital communication system verification across R&D, manufacturing, and quality assurance. It delivers high-speed pattern generation and analysis from 1 kb/s to 2.7 Gb/s with configurable channel density, deep memory per channel, and flexible front-end options. The system operates as a standalone generator, integrated generator/analyzer, or as modules within standard VXI test platforms.
Technical Specifications
Data Rates & Channels
• Generator and analyzer speeds: 200 Mb/s, 675 Mb/s, 2.7 Gb/s
• Frequency range: 1 kb/s to 2.7 Gb/s
• Up to 128 RZ channels or 240 channels at 333 MHz
• Up to 8 Mbit memory per channel (standard modules); 512 Kb per channel (low-speed front-ends)
Pattern Generation & Analysis
• Hardware-generated PRBS/PRWS sequences up to 2^15-1
• Supported formats: RZ, R1, NRZ, DNRZ
• Sequencing with up to 5 nested looping levels
• Event-based branching on internal and external triggers
• Boolean channel addition for complex signal synthesis, including return-to-complement
Timing Performance
• 1 ps timing resolution
• ±30 ps edge placement accuracy
Front-End Options
• 2.7 Gb/s: single channel, differential, 1.8 Vpp
• 675 MHz: RZ/NRZ with variable transition times, differential, 3.5 Vpp
• 200 Mbit/s: dual channel NRZ, single-ended, 3.5 Vpp
• 675 MSa/s: dual channel, 50 Ohm, 1 GHz bandwidth
• 333 MSa/s: dual channel, selectable 50 Ohm/high-impedance, 350 MHz bandwidth
– Key Features
• Modular architecture supports multiple data module types (E4841A, E4861A, E4832A) with independent generator and analyzer front-ends
• Flexible channel configurations from 2 to 128+ channels depending on module selection
• Clock modules (E4805A, E4831A, E4805B) provide system synchronization; E4805B drives up to eleven data modules
• Dual generator/analyzer front-ends enable high-channel-density configurations
– Typical Applications
• Digital communication system validation and characterization
• Protocol and standard compliance testing
• Device and component functional verification
• Manufacturing and production test environments
– Compatibility & Integration
• Remote control via LAN and GPIB
• VXI instrument slot compatibility for integrated test systems
• Standalone or networked operation
