The Keysight/Agilent/HP 8657B Signal Generator with Option 003 is a synthesized RF signal generator delivering precise, stable output across 100 kHz to 2060 MHz for receiver testing, component characterization, and general RF applications. Option 003 adds pulse modulation capability, extending the instrument’s utility into advanced RF and microwave test scenarios. The 8657B combines exceptional spectral purity with low phase noise and minimal residual FM, meeting stringent requirements in R&D, manufacturing, and laboratory environments.
Technical Specifications
Frequency Performance
• Range: 100 kHz to 2060 MHz
• Resolution: 1 Hz
• Switching speed: <35 ms
• Carrier frequency accuracy (DC mode): ±500 Hz to ±1000 Hz depending on frequency band
• Frequency drift (typical): <10 Hz per hour
• Timebase aging rate (8657B standard): 1.5 × 10⁻⁸ parts/day after 10 days
• Temperature stability: ±10 ppm (0 to 55 °C)
Output Level
• Range: +13 dBm to –143.5 dBm
• Resolution: 0.1 dBm
• Absolute accuracy: ±1.0 dB (typical ±0.5 dB)
• Level flatness: ±0.5 dB (at 0 dBm, 100 kHz to 2.06 GHz)
• Output impedance: 50 Ω
• SWR: <2.0 for levels ≤ +13 dBm
• Reverse power protection: Up to 50 Watts
Modulation
• Standard modes: AM, FM
• Option 003 enhancement: Pulse modulation
• Internal modulation rates: 400 Hz and 1 kHz (±2%)
• External modulation rates: 20 Hz to 100 kHz (8657B typical)
• AM depth: 0 to 100%
• FM distortion (internal rates): Typically <1.5%
• Carrier phase adjustment: 1-degree increments
Spectral Purity
• SSB phase noise (CW mode, 20 kHz offset, 0.1 to 130 MHz): <–124 dBc/Hz (typical <–130 dBc/Hz)
– Key Features
• Simultaneous and mixed AM/FM modulation
• High-stability timebase option (Option 001)
• Fast frequency switching for rapid test sequences
• 50 Ω output with integrated reverse power protection
– Typical Applications
• Receiver sensitivity and selectivity testing
• RF/microwave component characterization
• Modulation quality assessment
• Phase noise and spectral purity measurements
– Compatibility & Integration
The 8657B accepts multiple option configurations for enhanced functionality and operates as a standalone instrument or integrated into automated test systems.
