The Keysight E1432-61602 is an 8-channel voltage breakout box that provides direct signal access from VXI digitizer modules to external measurement systems. It terminates sub-miniature “D” connectors in a compact form factor, enabling straightforward signal routing and grounding configuration for laboratory and field testing environments.
Technical Specifications
Electrical Interface
• Sub-miniature “D” connectors with signal pass-through
• Manual grounding switches per connector (GND and DIFF positions)
• GND position: connector shell grounded to VXI mainframe chassis ground
• DIFF position: connector shell floats unless grounded at system level (e.g., sensor location)
Physical
• Card Type: C-Size VXI Card
• Ship Weight: 5 lbs/ea
– Key Features
Direct signal pass-through from E1432A VXI digitizer modules eliminates intermediate cabling complexity. Manual per-channel ground switching accommodates both single-ended and differential measurement topologies. The DIFF mode requires external grounding discipline—connector shells must be grounded elsewhere in the measurement chain to prevent floating reference potentials that degrade signal integrity.
Signal routing to sub-miniature “D” connectors simplifies temporary test setups and permanent system integrations alike.
– Typical Applications
• Laboratory-based voltage measurement and analysis
• Electronic system debugging and characterization
• Multi-channel data acquisition with flexible grounding options
• Integration with modular VXI test stations
– Compatibility & Integration
The E1432-61602 breakout box interfaces directly with the Keysight E1432A VXI digitizer. The E1432A module provides 16-channel, 51.2 kSa/s digitization across up to four 4-channel input assemblies. Maximum sample rate is 51,200 samples per second per channel with 16-bit resolution, 32 MB onboard RAM, and integrated transducer signal conditioning plus anti-alias protection. Onboard DSP and spurious-free dynamic range below −80 dBfs (−90 dBfs typical) support precision voltage measurement workflows in demanding test environments.
