The Keysight N5439A InfiniiMax III ZIF probe head delivers 28 GHz bandwidth for precision high-frequency measurements on modern semiconductor devices. Its Zero Insertion Force (ZIF) connector ensures reliable, repeatable contact with minimal mechanical stress to delicate test points. The probe head achieves a 20.9 psec rise time (10%-90%) and ultra-low input capacitance, making it ideal for capturing fast transients and low-level signals with minimal loading effects.
Technical Specifications
Electrical Performance
• Bandwidth: 28 GHz (typical)
• Rise Time: 20.9 psec (10%-90%, probe only with N2803A)
• Input Impedance (Differential): 100 kΩ resistance, 32 fF capacitance
• Input Impedance (Single-ended): 50 kΩ resistance, 48 fF capacitance
Input Voltage Range
With N5440A 450 Ω ZIF tip: 1.6 Vpp (±0.8 V, HD < -38 dB) or 2.5 Vpp (±1.25 V, HD < -34 dB)
With N5447A 200 Ω ZIF tip: 0.8 Vpp (±0.4 V, HD < -38 dB) or 1.6 Vpp (±0.8 V, HD < -34 dB)
Mechanical
• ZIF Tip Spacing (N5440A/N5447A): 5 mil to 80 mil (0.127 mm to 2 mm)
• ZIF Tip Spacing (N2838A): 5 mil to 250 mil (0.127 mm to 6.35 mm)
– Key Features
• Zero Insertion Force connection eliminates risk of contact damage
• Interchangeable ZIF tip options for varied impedance and spacing requirements
• Dual harmonic distortion performance grades accommodate different measurement priorities
• Low differential capacitance (32 fF) minimizes circuit loading
• Compatible with ceramic and PC board ZIF tips
– Typical Applications
• High-speed digital and mixed-signal IC characterization
• Multi-GHz signal integrity measurements
• Differential pair probing on contemporary processors and FPGAs
• Time-domain waveform acquisition requiring minimal probe loading
– Compatibility & Integration
Works with InfiniiMax III and III+ probe amplifiers, plus legacy N7000/1/2/3A, N2830/1/2A, N2800/1/2/3A, 1168/9B, and 1130/1/2/4B modules. Connects to Keysight Infiniium 90000-Q/X/Z Series, 86100D sampling oscilloscope, and UXR-series instruments (13-33 GHz and 40-110 GHz). The N2787A 3D positioner enables hands-free probe positioning for extended measurement sessions.
