The Keysight P5026B is a PC-based vector network analyzer delivering four-port measurements from 9 kHz to 32 GHz in a compact, portable form factor. This Streamline Series instrument connects via Thunderbolt 3 to a host computer, providing dynamic range to 137 dB and 50 Ω input impedance. The P5026B operates with the same GUI, SCPI command set, and measurement science as Keysight’s benchtop VNAs, making it suitable for R&D, manufacturing, and quality control applications where space constraints or portability matter.
Technical Specifications
• Frequency Range: 9 kHz to 32 GHz
• Ports: 4 (cascadable for N-port configurations)
• Input Impedance: 50 Ω
• Dynamic Range: Up to 137 dB (typical)
• IF Bandwidth: 1 MHz
• Interface: Thunderbolt 3 (USB Type-C connectors)
• Sweep Types: Linear, Log, Segment, CW, Power, DC source
• Calibration: Electronic Calibration (ECal) module support
– Key Features
• Compact, lightweight design optimized for space-constrained environments
• High-speed Thunderbolt 3 connectivity for improved measurement throughput
• Port cascading enables multiport measurement expansion
• Optional second source (Option 402) for intermodulation distortion measurements
• No internal data storage—suitable for classified environments
• Noise floor and trace noise performance comparable to benchtop instruments
• Excellent temperature stability
– Measurement Capabilities
• S-parameter measurements of high-power devices
• Full N-port calibration (>4 ports)
• Frequency offset mode (Option S97082B)
• Internal pulse generators and modulators (Options S970250B/S970251B)
• Noise figure measurement (Option S97029B)
• Time domain analysis and TDR (Option S97011B)
• Pulsed-RF measurements
• Automatic fixture removal
• Gain compression analysis
• Spectrum analysis
• Embedded LO capability
– Compatibility & Integration
The P5026B operates identically to Keysight’s benchtop VNA platforms, supporting the same measurement algorithms and command syntax. Integration with host PC via Thunderbolt 3 enables efficient data transfer and real-time measurement control.
