The Mini-Circuits eVNA-63+ is a 2-port vector network analyzer delivering full S-parameter characterization from 300 kHz to 6 GHz. This PC-controlled instrument combines high dynamic range (108–141 dB) with trace noise of 0.005 dB rms and a noise floor below -110 dBm/Hz, making it suitable for RF and microwave component testing across R&D and production environments. The eVNA-63+ connects via USB to a host PC and operates through eVNA Studio software, which provides an intuitive GUI, API access, SCPI command support, and offline simulation mode for measurement preparation without hardware. Built-in eMCal calibration, SOLT support, time-domain analysis with gating, port extension, and de-embedding capabilities enable accurate characterization of passive and active devices. Integrated bias-tees on both ports supply up to 24 V DC at 200 mA per port, ideal for powering amplifiers during gain and P1dB measurements. Output power ranges from -50 dBm to +10 dBm with variable port control. Maximum input levels reach +15 dBm below 10 MHz and +20 dBm from 10 MHz to 6 GHz. The instrument supports IF bandwidth from 0.001 kHz to 500 kHz, data export as Touchstone files, and vector visualization in rectangular, Smith chart, or polar formats.
Technical Specifications
• Frequency Range: 300 kHz to 6 GHz
• Frequency Resolution: 1 Hz
• Dynamic Range: 108 to 141 dB
• Trace Noise: 0.005 dB rms
• Dynamic Accuracy (Magnitude): Up to 0.35 dB
• Noise Floor: Less than -110 dBm/Hz
• Cross-talk: -115 dB
• Output Power: -50 dBm to +10 dBm
• IF Bandwidth: 0.001 kHz to 500 kHz
• Harmonics: -30 to -20 dBc
• Maximum Input Levels: +15 dBm below 10 MHz; +20 dBm from 10 MHz to 6 GHz
• DC Input Voltage: ±30 V maximum per port
• Supply Voltage: 24 V
• Bias-Tee Output: Up to 24 V DC at 200 mA per port
– Key Features
• Full 2-port, 2-path S-parameter measurements (S11, S12, S21, S22)
• eMCal electronic calibration and SOLT calibration support
• Time-domain transformation with gating for isolation of circuit sections
• Port extension and de-embedding for test fixture removal
• Marker-based automated bandwidth, limit, and ripple testing
• Data export to Touchstone (.snp) format
• Multi-format visualization: rectangular, Smith chart, polar plots
• Offline simulation mode for training and analysis without hardware
– Typical Applications
• Component characterization and RF device testing
• Amplifier gain and P1dB measurement with integrated bias-tees
• Time-domain impedance analysis and discontinuity detection
• Production test environments and R&D laboratories
– Compatibility & Integration
• USB connection to host PC
• eVNA Studio software with GUI and API
• SCPI command support for measurement automation
