The NI PXIe-8135 is a single-slot PXI Express embedded controller that combines Intel Core i5 processing with configurable memory and storage to deliver high-performance test and measurement capabilities. It integrates multiple I/O interfaces—Gigabit Ethernet, USB 3.0/3.1, DisplayPort/HDMI, and RS-232—alongside PXIe slot connectivity for direct communication with peripheral modules. The controller supports Windows 10 (64-bit) and Linux, with options for DDR4 SDRAM up to 32 GB and SSD storage starting at 128 GB, making it suitable for data-intensive applications requiring both local processing and distributed system integration within PXI chassis environments.
Technical Specifications
• Processor: Intel Core i5
• Memory: DDR4 SDRAM, configurable from 8 GB to 32 GB; ECC support available on select variants
• Storage: SSD starting at 128 GB capacity
• Graphics: Integrated Intel HD Graphics
• Operating System: Windows 10 (64-bit); Linux support available
• Form Factor: Single-slot PXIe controller with standard PXI module dimensions
• Cooling: Integrated fans for PXI chassis operation
– Key Features
• PXIe Hybrid slot compatibility for mixed PXI and PXIe peripheral module integration
• Gigabit Ethernet connectivity with optional Wi-Fi and Bluetooth on select configurations
• Multiple display outputs via DisplayPort or HDMI
• USB 3.0/3.1 ports for high-speed external device communication
• RS-232 serial ports for legacy device interfacing
• Audio input/output jacks
• SATA storage interfaces
• System timing and synchronization through native PXIe interface
– Typical Applications
• Complex test automation requiring distributed processing
• Data acquisition systems with real-time analysis
• Manufacturing and production test environments
• Instrumentation control and monitoring
• Embedded system development and validation
– Compatibility & Integration
The PXIe-8135 operates within PXI chassis power delivery architecture and supports PXIe high-bandwidth communication protocols. It functions as both a standalone embedded system and as the control hub for modular PXI/PXIe measurement and switching peripherals, enabling scalable test system design.
