The HP/Agilent 83623A, 83623B, 83623L, 83624A, 83624B, and 83624L are synthesized swept CW generators engineered for RF and microwave test applications demanding high spectral purity and precise frequency control. These instruments deliver broadband coverage with configurable output power, advanced modulation, and flexible sweep architectures suitable for component characterization, receiver validation, and system-level integration.
Technical Specifications
Frequency Coverage
• 83623A/B/L: 10 MHz to 20 GHz
• 83624A/B: 2 GHz to 20 GHz
• Frequency resolution: 1 Hz (Option 008) or 1 kHz standard (83624B)
Output Power
• 83623A: +17 dBm calibrated
• 83623B: +17 dBm calibrated
• 83623L: +15 dBm calibrated
• 83624A/B: +20 dBm calibrated
• With step attenuator (Option 001): –110 dBm minimum
• Power sweep range: –20 dBm to maximum rated output
Spectral Performance
• Harmonics: –50 dBc typical below 20 GHz
• Harmonic suppression: ≥25 dB below carrier (2.0–20 GHz); ≥35 dB (above 20 GHz); ≥50 dB (2.2–20 GHz)
• Phase noise: <–80 dBc at 10 GHz, 10 kHz offset; –76 dBc at 20 GHz, 10 kHz offset
Modulation & Sweep
• Modes: Step, List, Ramp
• Pulse and amplitude modulation (independent or simultaneous operation)
• AM: DC-coupled, 3 dB bandwidth 100 kHz
• FM: DC-coupled, rates to 8 MHz; maximum deviation ±8 MHz (locked)
• Scan modulation for antenna pattern simulation
• Fixed and swept frequency offset for two-tone measurements
• Internal Modulation Generator (Option 002); Fast Pulse Modulation (Option 006)
System Integration
• User flatness correction for remote test-point leveling
• MATE system compatibility (Option 700)
– Typical Applications
Component and subsystem testing across UHF, microwave, and millimeter-wave bands. Receiver sensitivity and selectivity characterization. System integration and validation requiring synthesized frequency agility and low-noise operation.
– Compatibility & Integration
Systems requiring MATE connectivity can be supported via Option 700. Modulation and attenuation options extend capability for specialized measurement scenarios.
