The Rohde & Schwarz FSP3 (Order No. 1093.4495.03) is a spectrum analyzer designed for signal analysis across 9 kHz to 3 GHz. Built on a fully digital architecture with integrated front-end processing, it delivers high reliability and specification performance across R&D, manufacturing, and field maintenance environments.
Technical Specifications
• Frequency Range: 9 kHz to 3 GHz
• Resolution Bandwidth: 1 Hz to 10 MHz
• Displayed Average Noise Level: < –145 dBm (10 Hz RBW); –155 dBm (1 Hz); –148 dBm
• Phase Noise: –113 dBc/Hz (1 Hz) at 10 kHz offset; –105 dBc/Hz at 10 kHz offset
• Measurement Uncertainty: 0.5 dB
• Input Impedance: 50 Ω
• Detectors: RMS, Quasi-peak
• Sweep Time: 2.5 ms minimum (frequency domain); 1 µs (time domain)
• Measurement Speed: Up to 55 GPIB measurements/s (frequency domain); up to 80 GPIB measurements/s (time domain), including trace transfer
• Display: 21 cm TFT color display
• Weight: 3.7 kg
• Operating Temperature: 0°C to +50°C
• Storage Temperature: –20°C to +70°C
• Maximum Operating Altitude: 2000 m
– Key Features
• Third-order intercept (TOI) and adjacent channel power (ACP) measurements with multicarrier capability
• Occupied bandwidth (OBW) and complementary cumulative distribution function (CCDF) analysis
• Amplitude statistics and EMI bandwidth measurements
• Fast statistical processing on digitally modulated signals
• Highly selective digital filtering and FFT-based analysis
– Typical Applications
Signal characterization in broadband and narrowband systems; modulation analysis; interference detection and measurement; EMI compliance testing.
– Compatibility & Integration
• Interfaces: GPIB, Centronics, RS-232-C, USB; optional LAN (100Base-T)
• PC drivers: LabWindows, LabVIEW; SCPI-compatible command set
• Windows printer support with screenshot capability
• External mixer support via LO OUT/IF IN ports (Option R&S FSP-B21)
• Compatible with R&S FSE and R&S FSIQ analyzers
Power Requirements: 100 V to 240 V AC ± 10%, 50 Hz to 60 Hz ± 5%; 140 VA input; 24 V / 3 A output (AC adapter).
