The Rohde & Schwarz AFQ100B is a 600 MHz I/Q modulation signal generator engineered for broadband digital communications and aerospace & defense applications. It generates complex waveforms with extremely short pulses and rapid rise/fall times, making it ideal for UWB radar systems and modern digital standards testing. The instrument combines arbitrary waveform generation with dual-mode clock architecture, supporting modulation formats from WiMAX and LTE to WiMedia UWB, with optional I/Q impairment simulation and equalization functionality.
Technical Specifications
• Frequency Range: 1 MHz to 600 MHz
• RF Bandwidth: 528 MHz (Mode 2)
• Clock Rate: 1 kHz to 300 MHz (Mode 1); up to 600 MHz (Mode 2)
• Waveform Memory: Up to 1 Gsample; options for 512 Msample (R&S AFQ-B12) or 1 Gsample (R&S AFQ-B11)
• Waveform Length: Mode 1 from 3 samples in 1-sample steps; Mode 2 from 6 samples in 2-sample steps
• Amplitude Resolution: 16 bit (analog and digital with R&S AFQ-B18 option)
• Marker Channels: 4 bit per sample
• I/Q Bandwidth: 100 MHz (Mode 1, 200 MHz RF equivalent); 264 MHz (Mode 2, 528 MHz RF equivalent)
• Spurious-Free Dynamic Range (SFDR): Typically 83 dBc
• Digital I/Q Outputs: 16 bit maximum resolution per channel in LVDS format
– Key Features
• Multiplexed LVDS digital output (Port 1) for clock rates to 100 MHz
• Optional 68-pin HD-SCSI Port 2 supporting higher data rates
• Dual-mode operation enabling flexible sample rate and memory configuration
• Linear frequency response across full bandwidth
• I/Q impairment simulation and equalization options
– Typical Applications
• Ultra-wideband (UWB) pulse and radar signal generation
• Digital communications standards development: WiMAX, LTE, WLAN 11n, WCDMA, HSPA+, WiMedia UWB (ECMA-368)
• Aerospace & defense signal testing with pulsed waveform scenarios
• Arbitrary complex waveform synthesis requiring high temporal resolution
– Compatibility & Integration
Digital outputs support Rohde & Schwarz internal digital interfaces and standard LVDS signaling protocols, enabling direct integration with test systems requiring high-speed I/Q data streams.
