The Synthesys Research BA1500 is a bit error rate (BER) testing system that combines eye pattern display, automatic jitter measurement, and advanced error analysis in a single chassis. Built on patented BitAlyzer® Error Analysis™ technology, it delivers comprehensive physical layer characterization from 1 Mb/s to 1.5 Gb/s with differential and single-ended I/O, variable amplitude/offset/threshold control, and pattern depths to 8 Mbit.
Technical Specifications
• Maximum Data Rate: 1.50 Gbps
• Maximum Clock Rate: 1500 MHz
• Pattern Depth: 8 Mbit
• Operating Data Rate Range: 1 Mb/s to 1.5 Gb/s
• Pattern Synchronization: PRBS and user-defined patterns up to 8 Mbits
• Clock Source: Internal or optional external (SMA connectors)
• Remote Control Interface: IEEE-488
• I/O Connectors: USB-A (four rear panel), D-sub 9 (COM1)
– Key Features
• Eye Pattern Display with rapid eye mask tests and Q-factor analysis (Physical Layer option)
• Automatic Random Jitter (RJ) and Deterministic Jitter (DJ) measurements
• BER Bathtubs with Q-factor measurements
• BitAlyzer® Error Analysis™ for detailed error stream characterization
• Error Location Analysis pinpoints exact bit error positions
• Error Mapping Analysis (BA1500MAP option) visualizes error correlations over time and blocks
• Flexible I/O: Differential and single-ended with variable amplitudes, offsets, and thresholds
– Advanced Options
• BA1500PL: Physical Layer Test Suite—Eye Diagram, Mask Test, BER Contour, Q-Factor, Jitter Peak measurements
• BA1500FEC: Forward Error Correction (FEC) Emulation for FEC architecture testing and error statistics analysis
• BA1500MAP: Error Mapping Analysis
• BA1500RACK: Rack Mounting Kit
– Compatibility & Integration
ISO9001-compliant calibration and repair services available. IEEE-488 remote control enables automated test integration.
