The Tektronix AWG710B is a high-performance arbitrary waveform generator delivering 4.2 GS/s sample rate and up to 2 GHz analog bandwidth for complex signal generation across disk drive design, communications testing, and semiconductor applications. The instrument combines 8-bit vertical resolution with record lengths up to 64.8M points (Option 01), ultra-low jitter performance, and dual-marker outputs with 300 fs timing resolution. Real-time sequencing supports up to 8,000 steps with conditional branching, while the graphical waveform editor and signal mixing capability—including two-signal digital mixing for noise and pre/de-emphasis testing—enable rapid prototyping of demanding test scenarios. Direct external clock input accommodates jittered and non-jittered signals for high-speed data stream timing margin analysis up to 4.2 Gb/s.
Technical Specifications
• Sample Rate: 4.2 GS/s
• Analog Bandwidth: Up to 2 GHz (Option 02)
• Vertical Resolution: 8-bit
• Record Length: 32.4M points standard; 64.8M points with Option 01
• Period Jitter: 2.6 psRMS typical (AWG710 at 4.2 GS/s)
• Cycle-to-Cycle Jitter: 4.8 psRMS typical (AWG710 at 4.2 GS/s)
• Marker Jitter: 2.0 psRMS typical (at 4.2 GS/s)
• Marker Timing Resolution: 300 fs
• Markers: 2 outputs with adjustable pulse widths and levels
• Standard Waveforms: Sine, Triangle, Square, Ramp, Pulse, DC
• Frequency Range (Standard Waveforms): 1.000 Hz to 400.0 MHz
• Amplitude (50 Ω): 0.020 Vp-p to 2 Vp-p (1 mV resolution)
• Offset (50 Ω): ±0.500 V (1 mV resolution); rails ±1.5 V
• Marker Output (50 Ω to GND): -1.1 V to 3.0 V; 1.2 Vp-p nominal (2.5 Vp-p open)
– Key Features
• Real-time sequencing with 1–8,000 steps and conditional branching
• Sequence event memory up to 65,536 or infinite steps
• Two-signal digital mixing for disk drive noise and serial data pre/de-emphasis testing
• Direct external clock input supporting jittered and non-jittered timing signals
• Dual markers with independent pulse width control
– Typical Applications
• Disk drive read channel design and validation
• High-speed communications (up to 4.2 Gb/s) signal generation and testing
• Semiconductor device characterization
• Timing margin analysis via external clock injection
– Compatibility & Integration
Synchronous operation mode and external clock input enable integration into multi-instrument test systems requiring phase-coherent signal generation and timing correlation.
