The Tektronix BSA125C BERTScope is a 12.5 Gb/s Bit Error Rate Analyzer engineered for signal integrity testing and characterization of high-speed serial data systems. It delivers precise bit error rate detection, advanced jitter decomposition, and mask compliance testing across data rates from 1 Gb/s to 12.5 Gb/s, supporting interfaces ranging from 1 Gb Ethernet through 16x Fibre Channel and 4x 25.78 Gb/s 100 Gb Ethernet.
Technical Specifications
Data Rate and Clocking
• Operating range: 1 Gb/s to 12.5 Gb/s
• High-speed BER measurements up to 28.6 Gb/s
• Clock outputs: 1–12.5 GHz with sub-rate outputs from 0.250 to 3.575 GHz
• Clock output frequency operates at ÷2 for data rates above 11.2 Gb/s
• Phase noise: < –90 dBc/Hz at 10 kHz offset (typical)
• Generator clock path with adjustable Spread Spectrum Clocking (SSC) modulation
• Sub-rate system clock support
Jitter Characterization
• Total Jitter (TJ), Random Jitter (RJ), and Deterministic Jitter (DJ)
• Sinusoidal Jitter (SJ) with internal frequencies from 1 kHz to 100 MHz
• Data Dependent Jitter (DDJ), Duty Cycle Distortion (DCD), and Emphasis Jitter (EJ)
• Inter-Symbol Interference (ISI), Uncorrelated Jitter (UJ), and Data Dependent Pulse Width Shrinkage (DDPWS)
• Sub-Rate Jitter (SRJ) including F/2 jitter measurement
• Direct non-extrapolated TJ measurement to 10⁻¹² BER and beyond
• MJSQ-compliant Dual Dirac jitter measurement
• Jitter Map option for decomposition analysis
Pattern Generation and Error Analysis
• Flexible memory sequencing with two levels of loop nesting
• Up to 1 million iterations per loop
• Patented Error Location Analysis™ for pattern-dependent, burst, and error-free interval analysis
• Pattern capture on all BERTScope analyzers
• Seven types of advanced error analysis
Signal Integrity and Compliance
• Electrical stressed eye testing
• Tolerance compliance template testing with margin analysis
• Mask Compliance Testing for XFP/XFI and OIF CEI standards
• Integrated eye diagram analysis with BER correlation
• Compliance Contour view for mask testing
• Physical Layer Test Suite with mask testing, jitter peak, BER contour, and Q-factor analysis
• Stressed receiver sensitivity and clock recovery jitter tolerance testing
• Support for PCI Express, 10/40/100 Gb Ethernet, SFP+/SFI, XFP/XFI, OIF/CEI, Fibre Channel, SATA, USB 3.0/3.1, and InfiniBand standards
Instrument Compatibility
Works with Tektronix CR125A, CR175A, and CR286A clock recovery instruments.
