The Tektronix FCA3020 is a 20 GHz frequency counter/analyzer delivering precision measurements across up to 3 input channels with 12-digit frequency resolution and 100 ps time resolution. Built for R&D, manufacturing, and service environments, it characterizes signal parameters through automated measurements, statistical analysis, and trend visualization. The instrument integrates into automated test systems via USB and GPIB interfaces, supporting both real-time data streaming and archived measurement retrieval at rates up to 250k samples/second internally.
Technical Specifications
• Frequency Range: DC to 20 GHz
• Time Resolution: 100 ps (single-shot)
• Frequency Resolution: 12 digits/second (up to 14 digits displayed)
• Phase Resolution: 0.001°
• Voltage Resolution: 3 mV or better
• Input Channels: Up to 3 channels
• Manual Trigger Frequency (Ch 1–2): Up to 400 MHz
• Measurement Rate: Up to 650 individually triggered measurements/second
• Internal Memory Transfer Rate: 250k samples/second (3.75M samples maximum)
• USB/GPIB Transfer Rate (block mode): Up to 15k samples/second
• Programmable Pulse Output: 0.5 Hz to 50 MHz
• Power Input: 90–265 VRMS, 45–440 Hz, <40 W
• Physical Dimensions: 90 mm H × 210 mm W × 395 mm D
– Key Features
• Automated measurements: frequency, period, ratio, time interval, time interval error, pulse width, rise/fall time, phase angle, duty cycle, voltage extrema, peak-to-peak voltage, and peak voltage
• Measurement statistics: average, minimum, maximum, standard deviation, and Allan deviation
• Histogram and trend plot modes for signal characterization
• Zero dead-time frequency and period measurements
• Modulation domain analysis support with optional TimeView Software
• Rear-panel 10 MHz reference oscillator output and external arming input
• SCPI programmable control with legacy ATE emulation mode
• Included National Instruments LabVIEW SignalExpress TE Limited Edition software
– Typical Applications
Frequency and timing validation in RF/microwave design, component characterization, signal integrity analysis, and production test environments requiring high-resolution phase and time interval measurements.
– Compatibility & Integration
USB device port and GPIB interface on rear panel enable PC integration and automated test system control. Supports SCPI commands and legacy instrument emulation for existing ATE workflows.
