Wavetek 278

The Wavetek 278 is a programmable synthesized function generator engineered for bench and ATE (Automatic Test Equipment) environments. It delivers precise waveform synthesis across 0.01 Hz to 12 MHz with 0.0005% accuracy, supporting sine, triangle, square, pulse, and DC offset outputs. The instrument operates in continuous, triggered, gated, and burst modes—with burst capability up to 1,048,200 cycles—making it ideal for logic-level testing and pulse characterization. Pulse generation features programmable period (90 ns to 1 sec), width, delay (80 ns to 0.1 sec), and independent upper/lower level control for ECL and TTL applications. Amplitude spans 0.01 to 10 Vp-p into 50 Ω with programmable DC offset from −5 V to +5 V. Synthesized frequency resolution reaches 5 digits; amplitude and offset each offer 3-digit resolution. The internal trigger source operates from 1 Hz to 24 MHz. External reference capability locks to a 10 MHz standard (zero-crossing or TTL input) for enhanced stability and phase coherence. The half-rack form factor integrates readily into production test systems. Data entry via front panel or GPIB (IEEE-488) interface accommodates free-format numeric input. Volatile memory stores up to 40 instrument configurations. Built-in 200 V output protection safeguards downstream circuits and components.