The Wayne Kerr 3225L is a calibration coil accessory designed for the Wayne Kerr 3200 Inductance Analysis System. It enables precise calibration and measurement of inductance, capacitance, and resistance across component evaluation workflows in electronics manufacturing, R&D, and service environments. The accessory integrates with the Wayne Kerr 3245 Precision Inductance Analyzer and up to five Wayne Kerr 3220A Bias Units to deliver four-terminal measurement capability that overcomes contact resistance variation issues, particularly for impedances below 10Ω.
Technical Specifications
The 3225L employs four-terminal connections with screened, twisted pair leads for sense and drive signal routing. This configuration minimizes electrical noise pickup and initial open-circuit errors during measurement. Each Wayne Kerr 3220A Bias Unit requires a power supply capable of 400 watts maximum with voltage selection between 115V or 230V. Auxiliary supply fuses are rated 0.25A-T (230V) and 0.5A-T (115V), while the switched mode power supply employs a 6A HRC fuse.
– Key Features
• Four-terminal measurement connections for component under test
• Screened, twisted pair leads for sense and drive connections
• Supports inductance (L), capacitance (C), and resistance (R) measurement
• Compatible with bias unit configurations for component analysis under load
• Minimizes contact resistance errors for low-impedance measurements (below 10Ω)
– Operational Requirements
Proper installation requires mounting on a non-metallic bench or support structure positioned at least one meter away from bias units and other equipment. Sense and drive leads must be placed together and secured to prevent movement that could alter short-circuit trim values. Correct grounding is essential for operator safety and measurement accuracy.
– Compatibility & Integration
The 3225L integrates directly with the Wayne Kerr 3245 Precision Inductance Analyzer and scales to five Wayne Kerr 3220A Bias Units within the 3200 system architecture. This modular approach supports flexible test configurations across single and multi-unit bias setups.
