The Wiltron 360 is a modular vector network analyzer that measures complex transmission and reflection characteristics of RF and microwave devices across frequencies from 40 MHz to 110 GHz. It acquires amplitude and phase information through frequency sweeping, characterizing S-parameters, gain, phase, and group delay of two-port components and subsystems. The system accommodates coaxial, microstrip, and waveguide measurements, with specialized configurations supporting both pulsed and continuous-wave operation plus time-domain analysis.
Technical Specifications
• Frequency Range: 40 MHz to 60 GHz (coaxial); 65 GHz or 67 GHz with specific test set options; up to 110 GHz with millimeter-wave test sets
• Measurement Parameters: S-parameters, gain, phase, group delay, complex transmission and reflection characteristics
• Analysis Modes: Frequency-domain sweeping, time-domain analysis, group delay measurements
• Measurement Types: CW and pulsed configurations supported
• Test Geometries: Coaxial, microstrip, waveguide
• Display: Large color screen with four-channel simultaneous display; Smith Chart, Rectilinear, and Polar formats; frequency and time-domain views; color-coded markers and limit lines
– Key Features
• Phase-locked signal sources covering 10 MHz to 18 GHz, 10 MHz to 40 GHz, and up to 65 GHz
• Advanced calibration techniques: LRL (Line-Reflect-Line) for microstrip and mixed-connector devices; SMA Calibration Kits for 12-term error correction
• Auto-Reference Delay compensation with selectable delay entry in distance or time units
• Data storage via 3.5-inch disk drive (720 KB, MS-DOS compatible)
• Hard-copy output to printer or plotter
• Front panel menu controls and GPIB interface for ATE integration
– Typical Applications
Research and development, production test, metrology, field service, and quality assurance of RF and microwave devices and systems.
– Compatibility & Integration
GPIB control interface enables integration into automatic test equipment environments. Modular architecture supports various test sets and signal sources tailored to specific frequency ranges and measurement requirements.
