The Yokogawa AQ7286A is a dual-wavelength Optical Time Domain Reflectometer (OTDR) for single-mode fiber characterization across 1310 nm and 1550 nm. Operating from 0.2 km to 512 km with dynamic ranges of 42 dB (1310 nm) and 40 dB (1550 nm), it delivers loss measurement accuracy of ±0.025 dB and distance accuracy of ±(0.75 m + measurement distance × 2 × 10⁻⁵ + 2 cm). Measurement times range from 30 seconds to 3 minutes with pulse widths selectable from 3 ns to 20000 ns. The instrument features an 8.4-inch color TFT LCD touchscreen, 15-hour Li-ion battery runtime, and stores over 1000 waveforms internally with external data export via USB and SD card.
Technical Specifications
Optical Performance
• Wavelengths: 1310 nm / 1550 nm
• Dynamic range: 42 dB (1310 nm), 40 dB (1550 nm)
• Event dead zone: 0.6 m
• Attenuation dead zone: 3.5 m / 4 m
• Distance range: 0.2 km to 512 km
• Distance accuracy: ±(0.75 m + measurement distance × 2 × 10⁻⁵ + 2 cm)
• Pulse width: 3 ns to 20000 ns
• Loss measurement accuracy: ±0.025 dB (typical)
• Loss measurement repeatability: ±0.015 dB (typical)
• Measurement time: 30 seconds to 3 minutes
Physical & Display
• Dimensions: 211 mm (W) × 110 mm (H) × 32 mm (D)
• Weight: 420–460 g
• Display: 8.4-inch color TFT LCD, 800 × 600 resolution, multi-touch capacitive
Power & Battery
• AC input: 100–240 VAC, 50–60 Hz
• Battery: Li-ion, 15-hour working time, 6-hour charge time
Connectivity & Storage
• Internal storage: >1000 waveforms
• External: USB 2.0 (Type-A × 2, Mini-B × 1), Ethernet, SD card
• Optical connectors: SC, FC, LC with universal adapters available
– Key Features
• Modular AQ7280 series platform accommodates OTDR, optical power meter, and visible light source modules
• Wavelength tolerance to ±10 nm (IEC 60793-1-40 compliant) available as option
• Dual operation modes via touchscreen and hard-key buttons
• Class 1M or 1 laser safety classification
– Environmental
• Operating: −10°C to 50°C, 0–90% RH
• Storage: −20°C to 60°C
– Typical Applications
Fiber optic cable verification, link loss characterization, fault location, and span attenuation analysis in R&D and field deployment environments.
