The Yokogawa DL9040L is a 4-channel digital oscilloscope designed for high-speed signal capture and detailed waveform analysis. Operating at 500 MHz bandwidth with a 5 GS/s maximum sampling rate, it delivers precise measurement and characterization of complex signals in electronics testing, signal analysis, and research environments. The instrument provides 6.25 Mpts/channel memory depth and supports acquisition rates up to 25,000 frames/sec/channel in Continuous Mode or 2.5 million frames/sec/channel in N Single Mode.
Technical Specifications
• Bandwidth: 500 MHz
• Maximum Sampling Rate: 5 GS/s
• Channels: 4
• Memory Depth: 6.25 Mpts/channel
• Waveform Storage: 2,000 frames
• Acquisition Rate (Continuous/Accumulate): Up to 25,000 frames/sec/channel
• Acquisition Rate (N Single Mode): Up to 2.5 million frames/sec/channel
• Interpolation: Up to 1,000× (2,000× in High-Resolution mode), achieving up to 2.5 TS/s time resolution
• FFT Analysis: Up to 250 k points
– Key Features
• Multiple acquisition modes: Normal, Envelope, Average, High Resolution, Repetitive Sampling, Interleave, and Interpolate
• History Memory function: Recall and analyze up to 2,000 previously acquired waveforms
• History Replay: Extended data capture over time
• Simultaneous XY1, XY2, and T-Y displays
• Automatic waveform parameter measurement: Up to 30 parameters (voltage, time, area, frequency, etc.) with 16 simultaneously displayed
• Waveform parameter statistics with trend tracking
• Real-time math functions: Basic arithmetic, integration, edge count, rotary count, and FFT analysis (up to 8 traces calculated simultaneously)
• Analog low-pass filtering: 200 MHz and 20 MHz
• Digital low-pass filtering: 8 MHz down to 8 kHz
• Waveform accumulation with Count/Time and Inten/Color options
• Zoom and search functionality with adjustable zoom ratio
• Auto-scroll for extended waveform observation
– Typical Applications
Signal integrity analysis, power electronics characterization, transient capture, frequency domain analysis, and long-term waveform trend monitoring.
– Compatibility & Integration
Compact form factor supports integration into laboratory and field test environments. Dot-density display technology enables high-resolution waveform visualization.
