The Advantest R3767A is a vector network analyzer that measures transmission and reflection characteristics across RF circuits, antennas, and electronic components from 300 kHz to 8 GHz. It delivers fast, accurate S-parameter and amplitude/phase measurements with 100 dB dynamic range and a noise floor of -100 dBm. The instrument supports single, 3-port, and 4-port configurations with measurement speeds as fast as 0.15 ms per point under normalized calibration.
Technical Specifications
• Frequency range: 300 kHz to 8 GHz
• Frequency accuracy: 0.002 %
• Frequency resolution: 1 Hz
• Measurement speed: 0.15 ms per point (normalized calibration); 0.25 ms per point (2-port full calibration)
• Dynamic range: 100 dB
• Displayed average noise floor: -100 dBm
• Maximum input level: 15 dBm
• Maximum output power: 10 mW
• Output impedance: 50 Ohm
– Key Features
• Vector network analysis with amplitude, phase, and group delay time measurement
• S-parameter measurement for forward and reverse characterization
• Multi-port capability: optional 3-port and 4-port test sets with full calibration functions
• Simultaneous dual measurement paths for enhanced multi-port efficiency
• 8.4-inch color TFT LCD with four-window split display; up to eight parameters viewable across four paths
• Time domain analysis with GATE function for reflection effects and phase linearity assessment
• Software fixture option (71/72) for impedance conversion without hardware impedance converters
• Built-in BASIC controller for automated measurement expansion
• Programmable sweep function with independent resolution bandwidth, power level, and measurement time per test point
• Electronic attenuator for amplifier performance and compression point measurement
• Direct Memory Access (DMA) with dual port memory for reduced data transfer time
• Limit line function for PASS/FAIL testing against user-defined criteria
– Typical Applications
• RF component characterization and validation
• Antenna design and performance analysis
• Transmission line and circuit network analysis
• Amplifier compression point and linearity testing
• Multi-port device evaluation
– Compatibility & Integration
The instrument integrates a built-in BASIC controller and supports direct memory access data transfer for integration into automated test environments.
