The Agilent 4291A Impedance/Material Analyzer delivers high-frequency impedance analysis and material characterization from 1 MHz to 1.8 GHz with ±0.8% basic accuracy. Using direct current-voltage measurement techniques rather than reflection methods, it provides direct readout of permittivity and permeability across impedance ranges from 0.1 Ω to 50 kΩ. The instrument serves R&D, quality control, and manufacturing environments requiring precise component evaluation and dielectric testing.
Technical Specifications
• Frequency Range: 1 MHz to 1.8 GHz with 1 mHz resolution
• Impedance Range: 0.1 Ω to 50 kΩ
• Basic Impedance Accuracy: ±0.8%
• Oscillator Voltage: 0.2 mVrms to 1 Vrms
• Oscillator Current: 4 µArms to 20 mArms
• Oscillator Power: −67 dBm to 7 dBm
• DC Bias (Option 001): 0 to ±40 V with 1 mV resolution; 20 µA to 100 mA with 20 µA resolution
• Test Cable: 1.8 meters error-corrected for extended reach without accuracy loss
– Key Features
• Direct measurement of permittivity and permeability for dielectric and magnetic materials
• Equivalent circuit analysis with automatic calculation of five circuit model parameters
• Bias-dependent impedance characterization capability
• Surface-mount device (SMD) measurement support
• Advanced calibration: Open/Short/50 Ω and Open/Short/Load compensation
• Port extension and electric length compensation
• Low loss calibration support
• Constant voltage or constant current measurement modes
• Color CRT split-display for active and memory trace comparison
• Floppy disk storage in LIF or MS-DOS format plus RAM disk memory
• HP-IB systems compatibility
• Internal frequency synthesizer with external 10 MHz reference input and internal 10 MHz reference output
– Typical Applications
Component impedance evaluation, dielectric material testing, magnetic material characterization, bias-dependent impedance analysis, and surface-mount component qualification across R&D, quality control, and manufacturing.
– Compatibility & Integration
HP-IB interface integration. Optional temperature chamber support (Option 1C2) for environmental parameter measurement. Optional high stability frequency reference (Option 1D5). Optional dielectric and magnetic material fixture integration (Option 002).
