The Agilent DSO9404A is a 4 GHz, 4-channel digital storage oscilloscope that combines oscilloscope, logic analyzer, and protocol analyzer capabilities in a single instrument for advanced signal analysis and debug. Built on the Infiniium platform, it delivers up to 20 GSa/s per channel sampling and standard 20 Mpts/channel memory (upgradeable to 1 Gpts/channel) with a responsive 15-inch XGA touchscreen display. The compact design—9 inches deep, 26 pounds—integrates broad measurement capability with fast waveform update rates, making it suitable for complex serial protocol and physical layer characterization.
Technical Specifications
• Bandwidth: 4 GHz
• Analog Channels: 4
• Sample Rate: Up to 20 GSa/s per channel (halved in four-channel configuration)
• Memory Depth: 20 Mpts/channel standard; upgradeable to 1 Gpts/channel (halved in four-channel use)
• Display: 15-inch XGA LCD with touchscreen
• Physical: 9 inches deep, 26 pounds
– Key Features
• Segmented memory capture on analog and digital channels for burst recording without idle period memory consumption
• Serial protocol decoding: I²C, SPI, RS-232, CAN, LIN, FlexRay, JTAG, PCI Express, USB 2.0, MIPI D-Phy, SATA, 8B/10B
• Serial physical layer analysis for USB 2.0, DDR 1/2/3, Ethernet, and MIPI D-Phy
• Logic analyzer (MSO models): 16 high-speed digital channels with 128 Mpts standard memory
• Protocol analyzer with integrated packet viewers and protocol-to-physical layer time correlation
• Jitter analysis via EZJIT and EZJIT Plus applications
• PCIe and USB 2.0 compliance testing with packet triggering and decoding
• Memory design analysis using automated JEDEC-based test routines
• MATLAB integration for custom measurements, user-defined filters, and instrument applications
– Advanced Triggering & Analysis
• InfiniiScan advanced trigger system (Option 009)
• High-speed serial data analysis and clock recovery (Option 003)
• Deep memory operation maintaining fast sample rates with responsive waveform updates
– Typical Applications
Serial protocol debug, physical layer characterization, jitter measurement, memory device testing, and PCIe/USB compliance validation.
