The Agilent E2613A Wedge Probe Adapter enables non-invasive probing of fine-pitch integrated circuits in TQFP and PQFP packages with 0.5 mm lead pitch. This specialized accessory provides 16 signal contacts using compressible dual conductors that insert between adjacent IC pins, creating redundant contact points for enhanced electrical reliability. The mechanical design eliminates soldering requirements and reduces risks of pin damage or cross-pin shorts during debug and test operations on densely populated PCBs.
Technical Specifications
• Package Compatibility: TQFP and PQFP at 0.5 mm pitch
• Signal Contacts: 16
• Operating Voltage: Less than 40 V (dc + peak ac)
• Operating Current: 0.5 A maximum
• Contact Resistance: Less than 0.1 Ω
• Capacitance: 2 pF typical between contacts
• Self-Inductance: 15 nH typical
• Cross Coupling: −31 dB typical at 100 MHz
• Wedge Pin Size: 0.025 inches square; accepts 0.015- to 0.025-inch square pin sockets
– Key Features
• Compressible dual-conductor contact mechanism for redundant pin connectivity
• Hands-free mechanical operation without soldering
• Ground connection provision for enhanced signal integrity
• Avoids invasive modifications to IC leads and adjacent pin shorts
• Low contact resistance and controlled impedance for signal fidelity
– Typical Applications
Suitable for debugging and characterization of microcontroller, ASIC, and FPGA designs in 0.5 mm pitch surface-mount packages. Enables real-time signal acquisition during functional test and validation workflows.
– Compatibility & Integration
Connects directly to Agilent logic analyzer probes, 1145A/1155A active probes, and passive probe families including 1160A-65A and N277xA series when used with N2777A/N2779A accessory kits. Compatible with standard oscilloscopes and logic analyzers via appropriate probe interfaces.
