The Agilent HP 5382A is a compact frequency counter engineered for accurate frequency, period, and totalizing measurements across RF and communications testing applications. Operating from DC to 225 MHz, this general-purpose instrument delivers user-selectable resolution up to 9 digits and features an intuitive digital display for real-time signal analysis. Built for RF technicians and laboratory environments requiring dependable performance in demanding test conditions.
Technical Specifications
Frequency Measurement
• Range: DC to 225 MHz
• Resolution: User selectable, up to 9 digits
Measurement Functions
• Frequency measurement of input signals
• Period measurement of input signals
• Totalizing (cycle counting) over specified intervals
Timebase
• Internal crystal oscillator
Input Characteristics
• Input impedance: Typically 1 MΩ || < 20 pF
• AC/DC selectable coupling
Display
• Bright digital readout with user-adjustable trigger level
Control & Operation
• Adjustable trigger level for precision measurements
• Arming functionality for selective measurement start/stop control
– Key Features
Compact bench-top form factor accommodates standard laboratory rack configurations. Crystal-controlled timebase ensures stable operation across extended measurement sessions. Input impedance and AC/DC coupling flexibility adapt to diverse signal conditioning requirements in production and field environments.
– Typical Applications
Frequency verification and characterization of RF components and assemblies. Period and duty-cycle analysis in communications systems development. Signal counting applications requiring 9-digit resolution in frequencies spanning DC through 225 MHz. General-purpose metrology in electronics manufacturing and service facilities.
– Compatibility & Integration
The 5382A integrates into test benches requiring standalone frequency measurement without external frequency reference dependencies. Standard input coupling and impedance characteristics enable direct connection to RF signal sources and communications test points.
