The Agilent/Keysight 33321RG is an electromechanical coaxial switch engineered for RF and microwave signal routing across DC to 26.5 GHz. Its latching configuration maintains switch position without continuous power, delivering energy efficiency and enhanced reliability in demanding test environments.
Technical Specifications
Frequency Range: DC to 26.5 GHz
RF Performance:
• Insertion Loss: <0.27 dB at 4 GHz; 120 dB at 4 GHz; >70 dB at 26.5 GHz
• SWR: <1.10 at 4 GHz; <1.60 at 26.5 GHz
Switching Characteristics:
• Latching electromechanical design with position retention
• Insertion loss repeatability: 0.03 dB over 1 million switching cycles
• Operating life: up to 2 million cycles
Control Options:
• Supply voltage: 5 V, 15 V, or 24 VDC
• Drive compatibility: standard or TTL/5 V CMOS
– Key Features
The 33321RG delivers consistent RF performance across its operating range with minimal insertion loss and excellent isolation characteristics. Guaranteed repeatability of 0.03 dB over extended cycling ensures stable performance in automated test systems requiring frequent switching. The latching mechanism eliminates holding power, reducing operational cost and heat dissipation in high-cycle applications.
Multiple control voltage options and CMOS-compatible drive levels simplify integration into existing control architectures. Compact form factor addresses space constraints in integrated test solutions.
– Typical Applications
• RF and microwave signal routing and multiplexing
• Automated test equipment (ATE) for wireless and satcom components
• High-frequency measurement systems requiring signal path selection
• Production test environments demanding extended component lifecycle
– Compatibility & Integration
Standard SMA connectors provide universal RF interface compatibility. Enhanced versions with 3.5 mm connectors offer improved ruggedness and measurement repeatability for precision applications. The switch accommodates 5 V, 15 V, and 24 VDC control supplies with TTL/CMOS drive compatibility for seamless integration with digital control systems and test frameworks.
