The Agilent/Keysight 54200A is a 2-channel digitizing oscilloscope engineered for precision waveform capture and analysis in laboratory and professional environments. Operating at 50 MHz bandwidth with 200 MSa/s real-time sampling and 1 kbyte of acquisition memory per channel, the instrument delivers sequential digitization at equal time increments for detailed signal characterization. Advanced trigger capabilities—including TTL and ECL preset functions—combined with high-quality ADC performance distinguish this platform for demanding measurement applications.
Technical Specifications
• Bandwidth: 50 MHz (-3 dB), DC and AC coupled
• Sampling Rate: 200 MSa/s maximum, real-time
• Channels: 2
• Acquisition Memory: 1 kbyte per channel
• Vertical Sensitivity: 40 mV to 40 V full-scale, continuously calibrated
• Gain Accuracy: ±2% of full-scale
• ADC Accuracy: +1.6% of full-scale
• Maximum Safe Input Voltage: 140 V peak
• Input Coupling: AC or DC selectable
• Time Base Range: 50 ns to 10 sec full-scale (1-2-5 sequence)
• Transition Time: 7 ns maximum (10% to 90%)
• Trigger Threshold Range: -9.9 V to +9.9 V in 100 mV increments
• Trigger Threshold Accuracy: ±2.5% ±120 mV
• Pre-trigger Storage: Up to 1 screen diameter
• Dynamic Range: 110 V about threshold
– Key Features
• Dual-channel simultaneous signal acquisition
• Non-blooming, fade-free display with variable persistence modes
• Envelope mode for worst-case analysis (maximum/minimum values)
• Average mode for signal-to-noise improvement on repetitive waveforms
• Time/voltage cursors for live and stored waveform measurement
• Stored waveform display concurrent with live acquisition
• Automatic waveform measurement and pulse parameter analysis
• 54200D variant adds digital logic trigger qualification
– Typical Applications
Circuit debugging, signal integrity verification, pulse characterization, and comparative waveform analysis in electronic design and troubleshooting.
– Compatibility & Integration
TTL and ECL trigger preset capabilities enable integration with external test systems and automated measurement workflows.
