The Agilent/Keysight 54645D is a 100 MHz mixed-signal oscilloscope that combines 2 analog channels with 16 digital channels on a single display for time-aligned capture and analysis. This instrument delivers 200 MSa/s sampling on analog channels and up to 400 MSa/s on 8 digital channels, with deep memory—1 MB per analog channel and 2 MB per digital channel—enabling extended waveform recording without sacrificing responsiveness.
MegaZoom technology provides intuitive pan-and-zoom navigation across captured data. The horizontal system spans 50 s/div to 5 ns/div sweep speeds with 40 ps resolution and ±0.01% accuracy on the main timebase. Pre-trigger delay extends at least 1 screen width or 2.5 msec, while post-trigger delay reaches 500 seconds, supporting detailed cause-and-effect analysis of complex circuit behavior.
Technical Specifications
• Bandwidth: 100 MHz
• Analog Channels: 2 at 200 MSa/s, 1 MB memory per channel
• Digital Channels: 16 at 200 MSa/s (or 8 channels at 400 MSa/s), 2 MB memory per channel
• Sweep Speed Range: 50 s/div to 5 ns/div (main and delayed)
• Horizontal Accuracy: ±0.01% (main), ±0.05% (vernier)
• Horizontal Resolution: 40 ps
• Input Impedance: 100 kΩ with ~8 pF input capacitance
• Input Dynamic Range: ±10 V about threshold
• Minimum Input Signal: 500 mV peak-to-peak
• Pre-defined Thresholds: TTL (1.4 V), CMOS (2.5 V), ECL (-1.3 V)
– Key Features
• Pattern Triggering: Define high, low, and don’t-care levels across all 16 digital channels, combinable with edge triggers
• Glitch Detection: Captures glitches from 8 ns to 100 seconds duration
• Trigger Modes: Auto, Autolevel, Normal, Single with holdoff from ~200 ns to 25 seconds
• Advanced Triggering: Glitch, TV, and pattern options available
– Physical & Interface
• Dimensions: 35.258 × 17.272 × 31.75 cm
• Weight: 6.35 kg
• Optional Modules: 54655A (HPIB/GPIB), 54657A (FFT, measurements, storage, real-time clock), 54659B (RS-232, parallel interface)
– Typical Applications
Embedded system debugging, digital design validation, and mixed-signal circuit characterization in environments requiring simultaneous analog-digital observation.
