The Agilent/Keysight 75000 Series is a modular system platform engineered for precision electronic test and measurement applications. Built on VXIbus and AXIe architectures, it delivers flexible multi-instrument configurations through an augmented local bus for inter-slot communication, synchronization, and module-to-module data movement. The platform scales horizontally or vertically, integrates via PCIe and LAN interfaces, and functions as a virtual PXI or benchtop instrument. Engineers configure the 75000 for applications spanning atomic force microscopy to precision current-voltage analysis, leveraging advanced timing and triggering capabilities across diverse measurement domains.
Technical Specifications
Modular Architecture
• VXIbus and AXIe platforms available
• Augmented local bus for inter-slot communication and synchronization
• PCIe and LAN interfaces for remote operation
• Horizontal or vertical configuration options
AFM Module (7500 AFM)
• XY scan range: 90 µm
• Z scan range: 12 µm
• XY positioning noise (closed-loop): < 0.15 nm typical
• Z noise level: < 0.03 nm
• XY linearity: < 0.5%
• Out-of-plane travel: < 0.1% full range
• Laser wavelength: 650 nm
• Video camera: 2 M pixel color, 1.7 µm resolution
• Sample stage manual travel (XY): ~10 mm; motorized (Z): ~10 mm
• Maximum sample diameter: ~25 mm; maximum height: ~8 mm
• Standard modes: Contact, LFM, AAC, Phase, CS-AFM, MFM, EFM, KFM, Liftmode, F-d Spectroscopy, F-V Spectroscopy, Force Modulation, Q-Control, LV PFM
• Optional modes: MAC, STM, PicoTREC, DLFM, Nanolithography, Electrochemistry, Heating/Cooling, Thermal K, PicoScript
• STM scanner available for pico-ampere and sub-pico-ampere current imaging
Precision IV Analysis Module
• Current measurement capability: 0.1 fA minimum
• Configurable SMU modules: up to 8 or 10 slots
• Measurement types: IV, CV, pulse/dynamic IV
• Integrated analysis without programming
– Key Features
• Patented top-down tip scanner technology for AFM
• PEEK polymer or stainless steel nose cones
• Advanced timing, triggering, and synchronization across modules
• Scalable current measurement from 0.1 fA
– Typical Applications
Atomic force microscopy, nanoscale characterization, current-voltage analysis, multi-parameter device testing.
– Compatibility & Integration
Operates as virtual PXI or benchtop instrument via PCIe and LAN; EasyEXPERT group+ software available.
